SFERA Archivio dei prodotti della Ricerca dell'Università di Ferrara

ZAMBELLI, Cristian
 Distribuzione geografica
Salva come PNG Salva come JPEG
Continente #
NA - Nord America 9.351
EU - Europa 5.334
AS - Asia 1.875
SA - Sud America 202
AF - Africa 20
Continente sconosciuto - Info sul continente non disponibili 5
OC - Oceania 2
Totale 16.789
Salva come PNG Salva come JPEG
Nazione #
US - Stati Uniti d'America 8.673
PL - Polonia 2.310
IT - Italia 815
DE - Germania 796
GB - Regno Unito 756
CN - Cina 743
SG - Singapore 670
CA - Canada 669
UA - Ucraina 279
TR - Turchia 238
BR - Brasile 188
FI - Finlandia 114
SE - Svezia 81
ID - Indonesia 77
FR - Francia 74
AT - Austria 36
KR - Corea 32
VN - Vietnam 22
NL - Olanda 20
HK - Hong Kong 16
TW - Taiwan 15
BE - Belgio 12
IN - India 11
RU - Federazione Russa 10
ZA - Sudafrica 8
IL - Israele 7
BD - Bangladesh 6
JP - Giappone 6
CZ - Repubblica Ceca 5
EU - Europa 5
MA - Marocco 5
AR - Argentina 4
CH - Svizzera 4
IQ - Iraq 4
MX - Messico 4
PY - Paraguay 4
ES - Italia 3
IR - Iran 3
KG - Kirghizistan 3
LT - Lituania 3
NO - Norvegia 3
NP - Nepal 3
PK - Pakistan 3
RO - Romania 3
UZ - Uzbekistan 3
AU - Australia 2
AZ - Azerbaigian 2
BO - Bolivia 2
EC - Ecuador 2
IE - Irlanda 2
OM - Oman 2
PA - Panama 2
PT - Portogallo 2
TN - Tunisia 2
AE - Emirati Arabi Uniti 1
AM - Armenia 1
AO - Angola 1
BG - Bulgaria 1
BY - Bielorussia 1
CL - Cile 1
EE - Estonia 1
EG - Egitto 1
GT - Guatemala 1
HN - Honduras 1
HU - Ungheria 1
JO - Giordania 1
KE - Kenya 1
LA - Repubblica Popolare Democratica del Laos 1
LB - Libano 1
LK - Sri Lanka 1
LV - Lettonia 1
ME - Montenegro 1
MY - Malesia 1
NI - Nicaragua 1
PS - Palestinian Territory 1
SA - Arabia Saudita 1
SC - Seychelles 1
SN - Senegal 1
VE - Venezuela 1
Totale 16.789
Salva come PNG Salva come JPEG
Città #
Warsaw 2.309
Fairfield 1.294
Woodbridge 980
Houston 666
Montréal 610
Mcallen 592
Ashburn 584
Munich 539
Seattle 527
Santa Clara 504
Wilmington 455
Cambridge 414
Ann Arbor 401
Jacksonville 372
Singapore 324
Ferrara 313
Chandler 281
Izmir 171
Beijing 141
Milan 139
Nanjing 132
Princeton 113
Addison 108
San Diego 84
Boardman 81
Jakarta 75
Shanghai 72
Dearborn 55
Helsinki 51
Ottawa 50
Settimo Milanese 49
Council Bluffs 42
Redwood City 35
Nanchang 34
Los Angeles 31
Changsha 29
Shenyang 28
Vienna 28
Hebei 24
Mountain View 24
Tianjin 24
Falkenstein 23
Falls Church 23
London 23
Norwalk 23
Des Moines 22
Dong Ket 22
Frankfurt An Der Oder 21
Napoli 21
Jiaxing 20
Bologna 18
Hangzhou 17
Guangzhou 15
Nuremberg 15
Auburn Hills 13
São Paulo 13
Hong Kong 12
Zhengzhou 12
Kunming 11
Phoenix 11
Indiana 10
Brussels 9
Jinan 9
Orange 9
Chicago 8
Toronto 8
Frankfurt am Main 7
Hounslow 7
New York 7
Washington 7
Brasília 6
Gif-sur-yvette 6
Seoul 6
Taipei 6
Bielefeld 5
Ningbo 5
Rome 5
Tappahannock 5
Baghdad 4
Cagliari 4
Capaccio 4
Changchun 4
Delft 4
Guarulhos 4
Johannesburg 4
Kidron 4
Paris 4
Redmond 4
Ribeirão Preto 4
Rio de Janeiro 4
Wuhan 4
Amsterdam 3
Belo Horizonte 3
Benevento 3
Bishkek 3
Campinas 3
Dresden 3
Herent 3
Islington 3
Jundiaí 3
Totale 13.324
Salva come PNG Salva come JPEG
Nome #
Phase Change and Magnetic Memories for Solid-State Drive Applications 2.101
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 436
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 431
RRAM Reliability/Performance Characterization through Array Architectures Investigations 397
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays 333
Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices 333
Automated characterization of TAS-MRAM test arrays 323
Radiation hard design of HfO2 based 1T1R cells and memory arrays 318
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms 311
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays 306
Reliability and Cell-to-Cell Variability of TAS-MRAM arrays under cycling conditions 303
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance 301
Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays 301
ATHENIS_3D: Automotive tested high-voltage and embedded non-volatile integrated SoC platform with 3D technology 284
SSDExplorer: a Virtual Platform for Performance/Reliability-oriented Fine-Grained Design Space Exploration of Solid State Drives 199
ELECTRICAL CHARACTERIZATION, PHYSICS, MODELING AND RELIABILITY OF INNOVATIVE NON-VOLATILE MEMORIES 193
Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays 188
Reliability challenges in 3D NAND Flash memories 177
Simulations of the software-defined flash 170
Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance 166
System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems 154
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives 153
LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives 153
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays 145
Fundamental variability limits of filament-based RRAM 139
Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization 137
Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-Temperature accelerated tests 137
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories 136
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays 135
Characterization of the Over-Erase Algorithm in FN/FN embedded NOR Flash arrays 134
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM 133
Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers 131
Bit error rate analysis in Charge Trapping memories for SSD applications 131
Simulation of SSD’s power consumption 128
Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions 127
Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage 127
Analysis of reliability/performance trade-off in Solid State Drives 127
Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices 127
Power-supply impact on the reliability of mid-1X TLC NAND flash memories 126
Reliability and performance characterization of a mems-based non-volatile switch 125
A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique 124
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays 124
SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives 123
Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs 123
Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays 122
Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays 121
Reliability of 3D NAND Flash Memories 121
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives 121
Architectural and Integration Options for 3D NAND Flash Memories 120
Limits of sensing and storage electronic components for high-reliable and safety-critical automotive applications 120
Resistive RAM endurance: Array-level characterization and correction techniques targeting deep learning applications 120
Erratic Bits Classification for Efficient Repair Strategies in Automotive Embedded Flash Memories 118
A Statistical Model of Erratic Behaviors in Flash Memory Arrays 117
Resistive RAM technology for SSDs 117
SSDExplorer: A virtual platform for SSD simulations 117
Characterization of a MEMS-based embedded non volatile memory array for extreme environments 117
Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories 117
Modeling the Endurance Reliability of Intra-disk RAID Solutions for mid-1X TLC NAND Flash Solid State Drives 116
Simulations of RRAM-based SSDs 115
Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays 114
Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off 114
Statistical analysis of resistive switching characteristics in ReRAM test arrays 113
A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis 113
Analysis and Optimization of Erasing Waveform in Phase Change Memory Arrays 112
A new automated methodology for Random Telegraph Signal identification and characterization: a case study on Phase Change Memory arrays 111
A Compact Model for Erratic Event Simulation in Flash Memory Arrays 110
Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays 109
Design trade-offs for NAND flash-based SSDs 109
An automated test equipment for characterization of emerging MRAM and RRAM arrays 108
Multilevel HfO2-based RRAM devices for low-power neuromorphic networks 108
Statistical Modeling of Secondary Path during Erase Operation in Phase Change Memories 107
A New Analytical Model of the Erasing Operation in Phase Change Memories 107
Modeling of SET Seasoning Effects in Phase Change Memory Arrays 104
Uniform and concentrated read disturb effects in mid-1X TLC NAND flash memories for enterprise solid state drives 104
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices 103
Exposing Reliability/Performance Trade-Off in Non-Volatile Memories through Erratic Bits Signature Classification 101
null 101
About the intrinsic resistance variability in HfO2-based RRAM devices 101
Evidence of erratic behaviors in p-channel floating gate memories and cell architectural solution 100
Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing 100
Memory driven design methodologies for optimal SSD performance 97
Impact of the NAND Flash Power Supply on Solid State Drives Reliability and Performance 96
Compact Modeling of Negative Vₜ Shift Disturb in NAND Flash Memories 95
SSD reliability assessment and improvement 92
Low-energy inference machine with multilevel HfO2 RRAM arrays 89
null 87
null 87
The role of the bottom and top interfaces in the 1st reset operation in HfO2 based RRAM devices 86
Experimental characterization of SET Seasoning on Phase Change Memory arrays 85
null 83
SSD Reliability 80
Enabling Computational Storage Through FPGA Neural Network Accelerator for Enterprise SSD 80
Reliability of NAND Flash Memories 68
Toward Reliable Multi-Level Operation in RRAM Arrays: Improving Post-Algorithm Stability and Assessing Endurance/Data Retention 60
An energy-efficient in-memory computing architecture for survival data analysis based on resistive switching memories 55
Assessing the role of program suspend operation in 3d nand flash based solid state drives 54
Dynamic VTH Tracking for Cross-Temperature Suppression in 3D-TLC NAND Flash 53
null 52
null 47
A scalable bidimensional randomization scheme for tlc 3d nand flash memories 47
Totale 16.291
Salva come PNG Salva come JPEG
Categoria #
all - tutte 68.522
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 6.087
Totale 74.609
Salva come PNG Salva come JPEG


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20201.149 0 0 0 0 0 0 0 0 387 361 214 187
2020/20212.750 251 228 217 247 185 390 190 269 100 412 146 115
2021/20221.220 88 73 67 21 58 93 100 71 67 113 139 330
2022/20231.029 117 10 72 98 99 156 132 95 117 13 88 32
2023/2024521 64 60 16 14 38 47 27 38 12 12 13 180
2024/20251.981 70 150 276 59 317 379 149 252 329 0 0 0
Totale 17.139