ZAMBELLI, Cristian
 Distribuzione geografica
Continente #
NA - Nord America 8.646
EU - Europa 5.124
AS - Asia 1.108
Continente sconosciuto - Info sul continente non disponibili 5
AF - Africa 2
OC - Oceania 2
SA - Sud America 2
Totale 14.889
Nazione #
US - Stati Uniti d'America 7.984
PL - Polonia 2.309
IT - Italia 765
GB - Regno Unito 752
DE - Germania 744
CA - Canada 661
CN - Cina 606
UA - Ucraina 276
TR - Turchia 234
SG - Singapore 154
SE - Svezia 80
FR - Francia 73
FI - Finlandia 65
KR - Corea 28
ID - Indonesia 27
AT - Austria 25
VN - Vietnam 22
TW - Taiwan 13
BE - Belgio 8
NL - Olanda 8
IL - Israele 6
EU - Europa 5
IN - India 5
CH - Svizzera 4
JP - Giappone 4
CZ - Repubblica Ceca 3
ES - Italia 3
HK - Hong Kong 3
IR - Iran 3
RO - Romania 3
AU - Australia 2
IE - Irlanda 2
BG - Bulgaria 1
BR - Brasile 1
EC - Ecuador 1
EG - Egitto 1
HU - Ungheria 1
IQ - Iraq 1
LK - Sri Lanka 1
MA - Marocco 1
ME - Montenegro 1
MY - Malesia 1
PA - Panama 1
PT - Portogallo 1
Totale 14.889
Città #
Warsaw 2.309
Fairfield 1.294
Woodbridge 980
Houston 666
Montréal 610
Mcallen 592
Ashburn 577
Munich 531
Seattle 526
Wilmington 455
Cambridge 414
Ann Arbor 401
Jacksonville 372
Ferrara 311
Chandler 281
Izmir 171
Beijing 138
Milan 134
Nanjing 132
Princeton 113
Addison 108
Singapore 85
San Diego 84
Boardman 81
Shanghai 70
Dearborn 55
Settimo Milanese 49
Ottawa 48
Redwood City 35
Nanchang 34
Changsha 29
Shenyang 28
Jakarta 26
Hebei 24
Mountain View 24
Tianjin 24
Falls Church 23
Norwalk 23
Des Moines 22
Dong Ket 22
London 22
Vienna 22
Frankfurt An Der Oder 21
Napoli 21
Jiaxing 20
Hangzhou 17
Bologna 16
Auburn Hills 13
Guangzhou 12
Zhengzhou 12
Kunming 11
Phoenix 11
Indiana 10
Los Angeles 10
Orange 9
Chicago 8
Jinan 8
Hounslow 7
New York 7
Washington 7
Gif-sur-yvette 6
Seoul 6
Taipei 6
Bielefeld 5
Brussels 5
Helsinki 5
Ningbo 5
Tappahannock 5
Cagliari 4
Capaccio 4
Changchun 4
Delft 4
Kidron 4
Paris 4
Redmond 4
Wuhan 4
Benevento 3
Dresden 3
Herent 3
Islington 3
Lanzhou 3
Monza 3
Münster 3
Simi Valley 3
Southwark 3
Verona 3
Yellow Springs 3
Acton 2
Andover 2
Brno 2
Camposampiero 2
Castel Bolognese 2
Castrocaro Terme 2
Centro 2
Cernusco Lombardone 2
Chongqing 2
Den Haag 2
Duncan 2
Edinburgh 2
Frankfurt am Main 2
Totale 12.299
Nome #
Phase Change and Magnetic Memories for Solid-State Drive Applications 2.087
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 415
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 415
RRAM Reliability/Performance Characterization through Array Architectures Investigations 386
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays 315
Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices 310
Automated characterization of TAS-MRAM test arrays 305
Radiation hard design of HfO2 based 1T1R cells and memory arrays 303
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms 297
Reliability and Cell-to-Cell Variability of TAS-MRAM arrays under cycling conditions 291
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays 289
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance 285
Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays 284
ATHENIS_3D: Automotive tested high-voltage and embedded non-volatile integrated SoC platform with 3D technology 257
SSDExplorer: a Virtual Platform for Performance/Reliability-oriented Fine-Grained Design Space Exploration of Solid State Drives 179
ELECTRICAL CHARACTERIZATION, PHYSICS, MODELING AND RELIABILITY OF INNOVATIVE NON-VOLATILE MEMORIES 173
Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays 170
Reliability challenges in 3D NAND Flash memories 166
Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance 145
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives 135
System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems 133
Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-Temperature accelerated tests 127
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories 124
Characterization of the Over-Erase Algorithm in FN/FN embedded NOR Flash arrays 123
Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers 120
Fundamental variability limits of filament-based RRAM 120
Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization 120
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays 119
Simulations of the software-defined flash 119
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays 118
Bit error rate analysis in Charge Trapping memories for SSD applications 117
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM 116
Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage 115
Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices 115
Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions 112
Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays 112
A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique 111
LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives 111
Power-supply impact on the reliability of mid-1X TLC NAND flash memories 111
Resistive RAM endurance: Array-level characterization and correction techniques targeting deep learning applications 110
Reliability and performance characterization of a mems-based non-volatile switch 109
Reliability of 3D NAND Flash Memories 109
Analysis of reliability/performance trade-off in Solid State Drives 109
Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs 108
Characterization of a MEMS-based embedded non volatile memory array for extreme environments 108
Limits of sensing and storage electronic components for high-reliable and safety-critical automotive applications 107
SSDExplorer: A virtual platform for SSD simulations 107
Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays 106
Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays 106
Erratic Bits Classification for Efficient Repair Strategies in Automotive Embedded Flash Memories 106
Architectural and Integration Options for 3D NAND Flash Memories 106
Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off 105
SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives 105
Modeling the Endurance Reliability of Intra-disk RAID Solutions for mid-1X TLC NAND Flash Solid State Drives 105
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays 105
A Statistical Model of Erratic Behaviors in Flash Memory Arrays 104
Statistical analysis of resistive switching characteristics in ReRAM test arrays 104
Resistive RAM technology for SSDs 104
Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays 101
null 101
A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis 100
Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories 100
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives 100
Simulation of SSD’s power consumption 99
Multilevel HfO2-based RRAM devices for low-power neuromorphic networks 99
A new automated methodology for Random Telegraph Signal identification and characterization: a case study on Phase Change Memory arrays 98
Statistical Modeling of Secondary Path during Erase Operation in Phase Change Memories 97
Modeling of SET Seasoning Effects in Phase Change Memory Arrays 96
Analysis and Optimization of Erasing Waveform in Phase Change Memory Arrays 96
A Compact Model for Erratic Event Simulation in Flash Memory Arrays 94
A New Analytical Model of the Erasing Operation in Phase Change Memories 94
Design trade-offs for NAND flash-based SSDs 94
Uniform and concentrated read disturb effects in mid-1X TLC NAND flash memories for enterprise solid state drives 93
Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing 93
Evidence of erratic behaviors in p-channel floating gate memories and cell architectural solution 92
Simulations of RRAM-based SSDs 92
An automated test equipment for characterization of emerging MRAM and RRAM arrays 92
Exposing Reliability/Performance Trade-Off in Non-Volatile Memories through Erratic Bits Signature Classification 89
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Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices 86
About the intrinsic resistance variability in HfO2-based RRAM devices 86
null 83
Compact Modeling of Negative Vₜ Shift Disturb in NAND Flash Memories 82
SSD reliability assessment and improvement 82
Low-energy inference machine with multilevel HfO2 RRAM arrays 81
Memory driven design methodologies for optimal SSD performance 79
Impact of the NAND Flash Power Supply on Solid State Drives Reliability and Performance 79
The role of the bottom and top interfaces in the 1st reset operation in HfO2 based RRAM devices 78
Experimental characterization of SET Seasoning on Phase Change Memory arrays 76
SSD Reliability 72
Reliability of NAND Flash Memories 59
Enabling Computational Storage Through FPGA Neural Network Accelerator for Enterprise SSD 56
Toward Reliable Multi-Level Operation in RRAM Arrays: Improving Post-Algorithm Stability and Assessing Endurance/Data Retention 53
null 52
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Dynamic VTH Tracking for Cross-Temperature Suppression in 3D-TLC NAND Flash 46
Temperature impact and programming algorithm for RRAM based memories 31
IIRW 2019 Discussion Group II: Reliability for Aerospace Applications 30
Reliability of Logic-in-Memory Circuits in Resistive Memory Arrays 30
Totale 14.855
Categoria #
all - tutte 49.512
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 4.373
Totale 53.885


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20204.213 532 214 265 537 332 413 416 355 387 361 214 187
2020/20212.750 251 228 217 247 185 390 190 269 100 412 146 115
2021/20221.220 88 73 67 21 58 93 100 71 67 113 139 330
2022/20231.029 117 10 72 98 99 156 132 95 117 13 88 32
2023/2024521 64 60 16 14 38 47 27 38 12 12 13 180
2024/202566 66 0 0 0 0 0 0 0 0 0 0 0
Totale 15.224