ZAMBELLI, Cristian
 Distribuzione geografica
Continente #
NA - Nord America 13.229
AS - Asia 6.544
EU - Europa 6.450
SA - Sud America 996
AF - Africa 182
OC - Oceania 6
Continente sconosciuto - Info sul continente non disponibili 5
Totale 27.412
Nazione #
US - Stati Uniti d'America 12.296
SG - Singapore 2.376
PL - Polonia 2.366
CN - Cina 1.643
IT - Italia 1.014
GB - Regno Unito 928
DE - Germania 912
BR - Brasile 798
CA - Canada 762
VN - Vietnam 661
HK - Hong Kong 606
UA - Ucraina 315
TR - Turchia 276
FR - Francia 231
JP - Giappone 192
BD - Bangladesh 169
FI - Finlandia 157
IN - India 153
RU - Federazione Russa 134
MX - Messico 120
ID - Indonesia 109
SE - Svezia 105
NL - Olanda 101
ZA - Sudafrica 80
AR - Argentina 74
TW - Taiwan 50
ES - Italia 49
IQ - Iraq 46
KR - Corea 45
AT - Austria 44
PK - Pakistan 39
CO - Colombia 29
VE - Venezuela 28
EC - Ecuador 23
MA - Marocco 21
TN - Tunisia 21
PH - Filippine 19
UZ - Uzbekistan 18
SA - Arabia Saudita 16
JO - Giordania 15
LT - Lituania 14
NP - Nepal 14
AE - Emirati Arabi Uniti 13
BE - Belgio 13
CH - Svizzera 13
IL - Israele 13
KE - Kenya 13
MY - Malesia 13
PY - Paraguay 13
CL - Cile 12
CR - Costa Rica 11
EG - Egitto 11
CZ - Repubblica Ceca 10
DO - Repubblica Dominicana 9
AZ - Azerbaigian 8
DZ - Algeria 8
AL - Albania 7
BO - Bolivia 7
PE - Perù 7
SN - Senegal 7
AU - Australia 6
KZ - Kazakistan 6
OM - Oman 6
ET - Etiopia 5
EU - Europa 5
HN - Honduras 5
IE - Irlanda 5
JM - Giamaica 5
KG - Kirghizistan 5
LB - Libano 5
PS - Palestinian Territory 5
PT - Portogallo 5
RO - Romania 5
BY - Bielorussia 4
SV - El Salvador 4
AO - Angola 3
BB - Barbados 3
GT - Guatemala 3
IR - Iran 3
KW - Kuwait 3
LK - Sri Lanka 3
NI - Nicaragua 3
NO - Norvegia 3
PA - Panama 3
RS - Serbia 3
SY - Repubblica araba siriana 3
TT - Trinidad e Tobago 3
UY - Uruguay 3
AM - Armenia 2
BG - Bulgaria 2
BH - Bahrain 2
EE - Estonia 2
GA - Gabon 2
GE - Georgia 2
HU - Ungheria 2
LV - Lettonia 2
MU - Mauritius 2
BA - Bosnia-Erzegovina 1
BM - Bermuda 1
BN - Brunei Darussalam 1
Totale 27.393
Città #
Warsaw 2.361
Singapore 1.474
Ashburn 1.313
Fairfield 1.295
Woodbridge 980
San Jose 775
Houston 679
Montréal 610
Mcallen 592
Hong Kong 584
Munich 582
Santa Clara 569
Beijing 539
Seattle 538
Wilmington 460
Cambridge 416
Ann Arbor 401
Jacksonville 376
Ferrara 330
Chandler 281
Ho Chi Minh City 233
Dallas 177
Izmir 174
Tokyo 174
Milan 163
Hanoi 160
Council Bluffs 159
Los Angeles 159
New York 143
The Dalles 143
Nanjing 133
Lauterbourg 115
Princeton 113
Addison 108
London 95
Shanghai 90
San Diego 84
Boardman 83
Mexico City 80
Jakarta 79
São Paulo 77
Helsinki 70
Chicago 64
Dearborn 56
Ottawa 52
Orem 51
Settimo Milanese 49
Chennai 48
Johannesburg 47
Amsterdam 42
Phoenix 41
Moscow 40
Brooklyn 39
Da Nang 39
Tianjin 37
Denver 36
Redwood City 36
Atlanta 35
Nanchang 34
Montreal 33
Toronto 33
Changsha 32
Vienna 32
Frankfurt am Main 30
San Francisco 30
Bologna 29
Boston 29
Columbus 29
Shenyang 29
Des Moines 28
Hangzhou 28
Manchester 28
Falkenstein 27
Taipei 27
Hefei 26
Nuremberg 26
Hebei 24
Mountain View 24
Rio de Janeiro 24
Rome 24
Stockholm 24
Buffalo 23
Falls Church 23
Norwalk 23
Poplar 23
Dong Ket 22
Frankfurt An Der Oder 21
Napoli 21
Baghdad 20
Jiaxing 20
Guangzhou 19
Haiphong 19
Mumbai 19
Brasília 18
The Hague 18
Washington 17
Tashkent 16
Turku 16
New Delhi 15
Amman 14
Totale 19.696
Nome #
Phase Change and Magnetic Memories for Solid-State Drive Applications 2.187
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 508
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 502
RRAM Reliability/Performance Characterization through Array Architectures Investigations 474
Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices 419
Automated characterization of TAS-MRAM test arrays 415
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays 412
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms 411
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance 401
Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays 383
ATHENIS_3D: Automotive tested high-voltage and embedded non-volatile integrated SoC platform with 3D technology 370
Reliability and Cell-to-Cell Variability of TAS-MRAM arrays under cycling conditions 369
Radiation hard design of HfO2 based 1T1R cells and memory arrays 368
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays 364
SSDExplorer: a Virtual Platform for Performance/Reliability-oriented Fine-Grained Design Space Exploration of Solid State Drives 324
Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays 312
ELECTRICAL CHARACTERIZATION, PHYSICS, MODELING AND RELIABILITY OF INNOVATIVE NON-VOLATILE MEMORIES 296
Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance 293
Simulations of the software-defined flash 257
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives 251
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM 250
System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems 245
LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives 240
A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique 238
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays 235
Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers 233
Architectural and Integration Options for 3D NAND Flash Memories 230
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives 230
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories 226
A Statistical Model of Erratic Behaviors in Flash Memory Arrays 223
Reliability challenges in 3D NAND Flash memories 222
Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays 218
Fundamental variability limits of filament-based RRAM 217
Analysis of reliability/performance trade-off in Solid State Drives 216
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays 214
A Compact Model for Erratic Event Simulation in Flash Memory Arrays 213
Simulation of SSD’s power consumption 213
An automated test equipment for characterization of emerging MRAM and RRAM arrays 213
A new automated methodology for Random Telegraph Signal identification and characterization: a case study on Phase Change Memory arrays 212
Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-Temperature accelerated tests 209
A New Analytical Model of the Erasing Operation in Phase Change Memories 203
Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs 202
Analysis and Optimization of Erasing Waveform in Phase Change Memory Arrays 199
Reliability of 3D NAND Flash Memories 198
A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis 198
Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions 197
Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization 197
An energy-efficient in-memory computing architecture for survival data analysis based on resistive switching memories 193
Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories 193
Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage 192
Bit error rate analysis in Charge Trapping memories for SSD applications 191
Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays 191
Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices 191
Power-supply impact on the reliability of mid-1X TLC NAND flash memories 190
Characterization of the Over-Erase Algorithm in FN/FN embedded NOR Flash arrays 190
Impact of the NAND Flash Power Supply on Solid State Drives Reliability and Performance 188
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays 187
SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives 186
Resistive RAM technology for SSDs 186
Resistive RAM endurance: Array-level characterization and correction techniques targeting deep learning applications 186
Deep-learning survival analysis for patients with calcific aortic valve disease undergoing valve replacement 185
An HPC Pipeline for Calcium Quantification of Aortic Root From Contrast-Enhanced CCT Scans 181
Reliability and performance characterization of a mems-based non-volatile switch 181
Characterization of a MEMS-based embedded non volatile memory array for extreme environments 180
Simulations of RRAM-based SSDs 179
Limits of sensing and storage electronic components for high-reliable and safety-critical automotive applications 178
Erratic Bits Classification for Efficient Repair Strategies in Automotive Embedded Flash Memories 177
SSDExplorer: A virtual platform for SSD simulations 176
About the intrinsic resistance variability in HfO2-based RRAM devices 175
Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off 172
High throughput edit distance computation on FPGA-based accelerators using HLS 171
Design trade-offs for NAND flash-based SSDs 171
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices 171
Machine Learning and Non-volatile Memories 170
Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays 170
Memory driven design methodologies for optimal SSD performance 170
Modeling the Endurance Reliability of Intra-disk RAID Solutions for mid-1X TLC NAND Flash Solid State Drives 169
Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays 167
Evidence of erratic behaviors in p-channel floating gate memories and cell architectural solution 167
A scalable bidimensional randomization scheme for tlc 3d nand flash memories 166
Multilevel HfO2-based RRAM devices for low-power neuromorphic networks 162
Compact Modeling of Negative Vₜ Shift Disturb in NAND Flash Memories 161
Modeling of SET Seasoning Effects in Phase Change Memory Arrays 158
Statistical Modeling of Secondary Path during Erase Operation in Phase Change Memories 157
Statistical analysis of resistive switching characteristics in ReRAM test arrays 156
Uniform and concentrated read disturb effects in mid-1X TLC NAND flash memories for enterprise solid state drives 156
Enabling Computational Storage Through FPGA Neural Network Accelerator for Enterprise SSD 152
SSD reliability assessment and improvement 150
Assessing the role of program suspend operation in 3d nand flash based solid state drives 149
Exposing Reliability/Performance Trade-Off in Non-Volatile Memories through Erratic Bits Signature Classification 146
Investigating 3D NAND Flash Read Disturb Reliability with Extreme Value Analysis 146
Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing 145
Modeling 3D NAND Flash with Nonparametric Inference on Regression Coefficients for Reliable Solid-State Storage 143
The role of the bottom and top interfaces in the 1st reset operation in HfO2 based RRAM devices 143
Experimental characterization of SET Seasoning on Phase Change Memory arrays 139
Low-energy inference machine with multilevel HfO2 RRAM arrays 138
Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks 136
Accurate Program/Verify Schemes of Resistive Switching Memory (RRAM) for In-Memory Neural Network Circuits 135
Benchmarking a DNN for aortic valve calcium lesions segmentation on FPGA-based DPU using the vitis AI toolchain 131
SSD Reliability 129
Totale 24.079
Categoria #
all - tutte 107.220
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 9.021
Totale 116.241


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/20221.220 88 73 67 21 58 93 100 71 67 113 139 330
2022/20231.029 117 10 72 98 99 156 132 95 117 13 88 32
2023/2024521 64 60 16 14 38 47 27 38 12 12 13 180
2024/20253.202 70 150 276 59 317 379 149 252 354 443 519 234
2025/20269.249 675 442 747 1.132 1.445 568 1.082 496 935 1.023 473 231
2026/2027210 210 0 0 0 0 0 0 0 0 0 0 0
Totale 27.819