SFERA Archivio dei prodotti della Ricerca dell'Università di Ferrara

ZAMBELLI, Cristian
 Distribuzione geografica
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Continente #
NA - Nord America 11.148
EU - Europa 5.981
AS - Asia 4.498
SA - Sud America 783
AF - Africa 107
Continente sconosciuto - Info sul continente non disponibili 5
OC - Oceania 2
Totale 22.524
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Nazione #
US - Stati Uniti d'America 10.298
PL - Polonia 2.356
SG - Singapore 1.771
CN - Cina 1.322
GB - Regno Unito 889
DE - Germania 885
IT - Italia 874
CA - Canada 725
BR - Brasile 684
HK - Hong Kong 523
UA - Ucraina 304
TR - Turchia 249
VN - Vietnam 210
FI - Finlandia 133
RU - Federazione Russa 125
FR - Francia 102
MX - Messico 102
SE - Svezia 95
ID - Indonesia 93
IN - India 81
NL - Olanda 80
ZA - Sudafrica 58
AT - Austria 42
AR - Argentina 41
JP - Giappone 37
KR - Corea 37
ES - Italia 35
TW - Taiwan 35
BD - Bangladesh 30
IQ - Iraq 18
MA - Marocco 13
TN - Tunisia 13
BE - Belgio 12
VE - Venezuela 12
CO - Colombia 11
IL - Israele 11
LT - Lituania 11
EC - Ecuador 10
PK - Pakistan 10
NP - Nepal 9
PY - Paraguay 9
UZ - Uzbekistan 9
CZ - Repubblica Ceca 8
JO - Giordania 8
KE - Kenya 8
AE - Emirati Arabi Uniti 7
CH - Svizzera 7
SA - Arabia Saudita 6
CL - Cile 5
EU - Europa 5
PE - Perù 5
DO - Repubblica Dominicana 4
EG - Egitto 4
HN - Honduras 4
SN - Senegal 4
AL - Albania 3
AZ - Azerbaigian 3
BO - Bolivia 3
CR - Costa Rica 3
DZ - Algeria 3
IE - Irlanda 3
IR - Iran 3
KG - Kirghizistan 3
KZ - Kazakistan 3
LB - Libano 3
MY - Malesia 3
NO - Norvegia 3
PA - Panama 3
RO - Romania 3
UY - Uruguay 3
AM - Armenia 2
AU - Australia 2
BB - Barbados 2
BG - Bulgaria 2
JM - Giamaica 2
KW - Kuwait 2
OM - Oman 2
PS - Palestinian Territory 2
PT - Portogallo 2
TT - Trinidad e Tobago 2
AO - Angola 1
BA - Bosnia-Erzegovina 1
BH - Bahrain 1
BN - Brunei Darussalam 1
BY - Bielorussia 1
CI - Costa d'Avorio 1
DM - Dominica 1
EE - Estonia 1
ET - Etiopia 1
GE - Georgia 1
GT - Guatemala 1
HU - Ungheria 1
LA - Repubblica Popolare Democratica del Laos 1
LK - Sri Lanka 1
LV - Lettonia 1
ME - Montenegro 1
NI - Nicaragua 1
RS - Serbia 1
SC - Seychelles 1
TJ - Tagikistan 1
Totale 22.524
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Città #
Warsaw 2.352
Fairfield 1.294
Woodbridge 980
Singapore 966
Ashburn 926
Houston 674
Montréal 610
Mcallen 592
Munich 582
Seattle 534
Santa Clara 522
Hong Kong 517
Beijing 470
Wilmington 458
Cambridge 414
Ann Arbor 401
Jacksonville 373
Ferrara 324
Chandler 281
Izmir 172
Dallas 158
Milan 143
Nanjing 132
Los Angeles 123
Princeton 113
The Dalles 110
Addison 108
Ho Chi Minh City 87
London 84
San Diego 84
New York 82
Shanghai 82
Boardman 81
Jakarta 76
Mexico City 75
São Paulo 64
Dearborn 55
Helsinki 53
Chicago 52
Ottawa 52
Settimo Milanese 49
Council Bluffs 43
Hanoi 42
Moscow 37
Amsterdam 36
Johannesburg 36
Tianjin 36
Phoenix 35
Redwood City 35
Nanchang 34
Changsha 31
Chennai 31
Vienna 31
Denver 30
Brooklyn 29
Shenyang 28
Columbus 27
Falkenstein 27
Tokyo 26
Des Moines 25
Hefei 25
Montreal 25
Hebei 24
Mountain View 24
Atlanta 23
Boston 23
Falls Church 23
Norwalk 23
Dong Ket 22
Toronto 22
Bologna 21
Frankfurt An Der Oder 21
Frankfurt am Main 21
Napoli 21
Nuremberg 21
San Francisco 21
Hangzhou 20
Jiaxing 20
Poplar 20
Rio de Janeiro 20
Manchester 19
Guangzhou 18
Taipei 18
Brasília 16
Orem 16
Stockholm 16
The Hague 16
Turku 16
Auburn Hills 13
Baghdad 12
Zhengzhou 12
Belo Horizonte 11
Delft 11
Kunming 11
Mumbai 11
Rome 11
Buffalo 10
Indiana 10
Salt Lake City 10
Secaucus 10
Totale 16.631
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Nome #
Phase Change and Magnetic Memories for Solid-State Drive Applications 2.139
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 477
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 477
RRAM Reliability/Performance Characterization through Array Architectures Investigations 432
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays 381
Automated characterization of TAS-MRAM test arrays 376
Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices 376
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms 370
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance 358
Radiation hard design of HfO2 based 1T1R cells and memory arrays 347
Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays 347
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays 335
Reliability and Cell-to-Cell Variability of TAS-MRAM arrays under cycling conditions 335
ATHENIS_3D: Automotive tested high-voltage and embedded non-volatile integrated SoC platform with 3D technology 319
ELECTRICAL CHARACTERIZATION, PHYSICS, MODELING AND RELIABILITY OF INNOVATIVE NON-VOLATILE MEMORIES 256
Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays 251
SSDExplorer: a Virtual Platform for Performance/Reliability-oriented Fine-Grained Design Space Exploration of Solid State Drives 250
Simulations of the software-defined flash 221
System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems 208
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives 208
Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance 207
Reliability challenges in 3D NAND Flash memories 203
A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique 200
LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives 198
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories 194
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays 194
Fundamental variability limits of filament-based RRAM 190
Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-Temperature accelerated tests 183
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays 182
Analysis of reliability/performance trade-off in Solid State Drives 182
Architectural and Integration Options for 3D NAND Flash Memories 181
Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers 180
Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays 179
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM 179
A Statistical Model of Erratic Behaviors in Flash Memory Arrays 177
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives 174
A Compact Model for Erratic Event Simulation in Flash Memory Arrays 172
Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs 172
Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions 170
A new automated methodology for Random Telegraph Signal identification and characterization: a case study on Phase Change Memory arrays 170
Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization 170
A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis 169
An automated test equipment for characterization of emerging MRAM and RRAM arrays 167
Characterization of the Over-Erase Algorithm in FN/FN embedded NOR Flash arrays 166
Bit error rate analysis in Charge Trapping memories for SSD applications 165
Analysis and Optimization of Erasing Waveform in Phase Change Memory Arrays 165
Power-supply impact on the reliability of mid-1X TLC NAND flash memories 164
Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays 164
Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories 164
Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices 164
Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage 163
A New Analytical Model of the Erasing Operation in Phase Change Memories 162
Reliability of 3D NAND Flash Memories 160
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays 160
Erratic Bits Classification for Efficient Repair Strategies in Automotive Embedded Flash Memories 159
Simulation of SSD’s power consumption 159
Reliability and performance characterization of a mems-based non-volatile switch 157
Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays 155
Limits of sensing and storage electronic components for high-reliable and safety-critical automotive applications 155
Characterization of a MEMS-based embedded non volatile memory array for extreme environments 155
SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives 154
Resistive RAM technology for SSDs 154
Resistive RAM endurance: Array-level characterization and correction techniques targeting deep learning applications 150
Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays 148
Simulations of RRAM-based SSDs 148
About the intrinsic resistance variability in HfO2-based RRAM devices 148
SSDExplorer: A virtual platform for SSD simulations 147
Memory driven design methodologies for optimal SSD performance 146
Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off 145
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices 144
Statistical Modeling of Secondary Path during Erase Operation in Phase Change Memories 143
Modeling the Endurance Reliability of Intra-disk RAID Solutions for mid-1X TLC NAND Flash Solid State Drives 141
Impact of the NAND Flash Power Supply on Solid State Drives Reliability and Performance 141
Modeling of SET Seasoning Effects in Phase Change Memory Arrays 140
An energy-efficient in-memory computing architecture for survival data analysis based on resistive switching memories 139
Statistical analysis of resistive switching characteristics in ReRAM test arrays 139
Design trade-offs for NAND flash-based SSDs 139
Evidence of erratic behaviors in p-channel floating gate memories and cell architectural solution 137
Multilevel HfO2-based RRAM devices for low-power neuromorphic networks 136
Uniform and concentrated read disturb effects in mid-1X TLC NAND flash memories for enterprise solid state drives 132
SSD reliability assessment and improvement 127
Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing 127
Exposing Reliability/Performance Trade-Off in Non-Volatile Memories through Erratic Bits Signature Classification 126
An HPC Pipeline for Calcium Quantification of Aortic Root From Contrast-Enhanced CCT Scans 124
Enabling Computational Storage Through FPGA Neural Network Accelerator for Enterprise SSD 124
Compact Modeling of Negative Vₜ Shift Disturb in NAND Flash Memories 122
The role of the bottom and top interfaces in the 1st reset operation in HfO2 based RRAM devices 121
Experimental characterization of SET Seasoning on Phase Change Memory arrays 119
A scalable bidimensional randomization scheme for tlc 3d nand flash memories 119
Low-energy inference machine with multilevel HfO2 RRAM arrays 118
Machine Learning and Non-volatile Memories 112
SSD Reliability 109
Toward Reliable Multi-Level Operation in RRAM Arrays: Improving Post-Algorithm Stability and Assessing Endurance/Data Retention 105
Deep-learning survival analysis for patients with calcific aortic valve disease undergoing valve replacement 103
Assessing the role of program suspend operation in 3d nand flash based solid state drives 102
null 101
Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks 100
Modeling 3D NAND Flash with Nonparametric Inference on Regression Coefficients for Reliable Solid-State Storage 100
Investigating 3D NAND Flash Read Disturb Reliability with Extreme Value Analysis 98
Accurate Program/Verify Schemes of Resistive Switching Memory (RRAM) for In-Memory Neural Network Circuits 95
Totale 20.516
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Categoria #
all - tutte 91.883
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 7.906
Totale 99.789
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/20211.622 0 0 0 0 0 390 190 269 100 412 146 115
2021/20221.220 88 73 67 21 58 93 100 71 67 113 139 330
2022/20231.029 117 10 72 98 99 156 132 95 117 13 88 32
2023/2024521 64 60 16 14 38 47 27 38 12 12 13 180
2024/20253.202 70 150 276 59 317 379 149 252 354 443 519 234
2025/20264.539 675 442 747 1.132 1.445 98 0 0 0 0 0 0
Totale 22.899