SFERA Archivio dei prodotti della Ricerca dell'Università di Ferrara

ZAMBELLI, Cristian
 Distribuzione geografica
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Continente #
NA - Nord America 12.815
AS - Asia 6.384
EU - Europa 6.343
SA - Sud America 980
AF - Africa 180
Continente sconosciuto - Info sul continente non disponibili 5
OC - Oceania 4
Totale 26.711
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Nazione #
US - Stati Uniti d'America 11.912
PL - Polonia 2.366
SG - Singapore 2.359
CN - Cina 1.622
IT - Italia 937
GB - Regno Unito 928
DE - Germania 910
BR - Brasile 789
CA - Canada 748
VN - Vietnam 656
HK - Hong Kong 599
UA - Ucraina 313
TR - Turchia 276
FR - Francia 228
JP - Giappone 189
FI - Finlandia 156
IN - India 150
RU - Federazione Russa 134
MX - Messico 118
ID - Indonesia 106
SE - Svezia 104
NL - Olanda 95
ZA - Sudafrica 80
BD - Bangladesh 75
AR - Argentina 68
TW - Taiwan 48
IQ - Iraq 46
AT - Austria 44
ES - Italia 43
KR - Corea 43
PK - Pakistan 39
CO - Colombia 29
VE - Venezuela 28
EC - Ecuador 23
TN - Tunisia 21
MA - Marocco 20
PH - Filippine 19
UZ - Uzbekistan 18
SA - Arabia Saudita 16
JO - Giordania 15
LT - Lituania 14
AE - Emirati Arabi Uniti 13
BE - Belgio 13
IL - Israele 13
KE - Kenya 13
MY - Malesia 13
NP - Nepal 13
PY - Paraguay 13
CL - Cile 11
EG - Egitto 11
CZ - Repubblica Ceca 10
AZ - Azerbaigian 8
CR - Costa Rica 8
DO - Repubblica Dominicana 8
DZ - Algeria 8
AL - Albania 7
BO - Bolivia 7
CH - Svizzera 7
PE - Perù 7
SN - Senegal 7
KZ - Kazakistan 6
OM - Oman 6
ET - Etiopia 5
EU - Europa 5
IE - Irlanda 5
KG - Kirghizistan 5
LB - Libano 5
PS - Palestinian Territory 5
AU - Australia 4
BY - Bielorussia 4
HN - Honduras 4
PT - Portogallo 4
RO - Romania 4
AO - Angola 3
IR - Iran 3
KW - Kuwait 3
NO - Norvegia 3
PA - Panama 3
RS - Serbia 3
SV - El Salvador 3
SY - Repubblica araba siriana 3
TT - Trinidad e Tobago 3
UY - Uruguay 3
AM - Armenia 2
BB - Barbados 2
BG - Bulgaria 2
BH - Bahrain 2
EE - Estonia 2
GA - Gabon 2
GE - Georgia 2
HU - Ungheria 2
JM - Giamaica 2
LK - Sri Lanka 2
LV - Lettonia 2
MU - Mauritius 2
NI - Nicaragua 2
BA - Bosnia-Erzegovina 1
BN - Brunei Darussalam 1
CG - Congo 1
CI - Costa d'Avorio 1
Totale 26.696
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Città #
Warsaw 2.361
Singapore 1.470
Fairfield 1.294
Ashburn 1.275
Woodbridge 980
San Jose 745
Houston 677
Montréal 610
Mcallen 592
Munich 582
Hong Kong 577
Santa Clara 541
Seattle 536
Beijing 530
Wilmington 459
Cambridge 416
Ann Arbor 401
Jacksonville 376
Ferrara 328
Chandler 281
Ho Chi Minh City 231
Izmir 174
Tokyo 173
Dallas 171
Hanoi 159
Milan 155
Los Angeles 142
The Dalles 142
Nanjing 133
New York 129
Lauterbourg 114
Princeton 113
Addison 108
Council Bluffs 99
London 95
Shanghai 90
San Diego 84
Boardman 82
Jakarta 79
Mexico City 78
São Paulo 76
Helsinki 70
Chicago 58
Dearborn 56
Ottawa 52
Orem 50
Settimo Milanese 49
Johannesburg 47
Chennai 46
Amsterdam 42
Moscow 40
Da Nang 39
Phoenix 39
Tianjin 37
Denver 36
Redwood City 36
Nanchang 34
Brooklyn 33
Atlanta 32
Changsha 32
Vienna 32
Montreal 31
Frankfurt am Main 30
Shenyang 29
Columbus 28
Manchester 28
San Francisco 28
Bologna 27
Boston 27
Des Moines 27
Falkenstein 27
Hangzhou 27
Hefei 26
Nuremberg 26
Taipei 26
Toronto 26
Hebei 24
Mountain View 24
Rio de Janeiro 24
Stockholm 24
Falls Church 23
Norwalk 23
Poplar 23
Dong Ket 22
Frankfurt An Der Oder 21
Napoli 21
Baghdad 20
Jiaxing 20
Guangzhou 19
Haiphong 19
Mumbai 19
Brasília 18
Tashkent 16
The Hague 16
Turku 16
New Delhi 15
Washington 15
Amman 14
Rome 14
Auburn Hills 13
Totale 19.394
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Nome #
Phase Change and Magnetic Memories for Solid-State Drive Applications 2.184
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 506
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 498
RRAM Reliability/Performance Characterization through Array Architectures Investigations 470
Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices 414
Automated characterization of TAS-MRAM test arrays 411
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays 410
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms 402
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance 400
Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays 378
Radiation hard design of HfO2 based 1T1R cells and memory arrays 367
ATHENIS_3D: Automotive tested high-voltage and embedded non-volatile integrated SoC platform with 3D technology 367
Reliability and Cell-to-Cell Variability of TAS-MRAM arrays under cycling conditions 364
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays 359
SSDExplorer: a Virtual Platform for Performance/Reliability-oriented Fine-Grained Design Space Exploration of Solid State Drives 309
Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays 308
ELECTRICAL CHARACTERIZATION, PHYSICS, MODELING AND RELIABILITY OF INNOVATIVE NON-VOLATILE MEMORIES 293
Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance 277
Simulations of the software-defined flash 255
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives 248
System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems 245
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM 238
A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique 236
LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives 235
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays 231
Architectural and Integration Options for 3D NAND Flash Memories 226
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives 225
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories 223
Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers 223
Reliability challenges in 3D NAND Flash memories 220
A Statistical Model of Erratic Behaviors in Flash Memory Arrays 218
Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays 217
Analysis of reliability/performance trade-off in Solid State Drives 216
A Compact Model for Erratic Event Simulation in Flash Memory Arrays 213
A new automated methodology for Random Telegraph Signal identification and characterization: a case study on Phase Change Memory arrays 211
Fundamental variability limits of filament-based RRAM 211
An automated test equipment for characterization of emerging MRAM and RRAM arrays 211
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays 210
Simulation of SSD’s power consumption 204
Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-Temperature accelerated tests 202
A New Analytical Model of the Erasing Operation in Phase Change Memories 200
Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs 199
A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis 198
Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions 197
Analysis and Optimization of Erasing Waveform in Phase Change Memory Arrays 197
Reliability of 3D NAND Flash Memories 196
Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization 194
Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories 191
An energy-efficient in-memory computing architecture for survival data analysis based on resistive switching memories 190
Bit error rate analysis in Charge Trapping memories for SSD applications 190
Characterization of the Over-Erase Algorithm in FN/FN embedded NOR Flash arrays 190
Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays 189
Power-supply impact on the reliability of mid-1X TLC NAND flash memories 188
Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage 187
SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives 186
Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices 186
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays 184
Impact of the NAND Flash Power Supply on Solid State Drives Reliability and Performance 182
Resistive RAM technology for SSDs 181
Resistive RAM endurance: Array-level characterization and correction techniques targeting deep learning applications 181
Reliability and performance characterization of a mems-based non-volatile switch 179
An HPC Pipeline for Calcium Quantification of Aortic Root From Contrast-Enhanced CCT Scans 177
Characterization of a MEMS-based embedded non volatile memory array for extreme environments 177
Erratic Bits Classification for Efficient Repair Strategies in Automotive Embedded Flash Memories 176
Simulations of RRAM-based SSDs 176
Limits of sensing and storage electronic components for high-reliable and safety-critical automotive applications 176
SSDExplorer: A virtual platform for SSD simulations 175
About the intrinsic resistance variability in HfO2-based RRAM devices 174
Deep-learning survival analysis for patients with calcific aortic valve disease undergoing valve replacement 169
Memory driven design methodologies for optimal SSD performance 169
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices 169
Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays 168
Design trade-offs for NAND flash-based SSDs 168
Modeling the Endurance Reliability of Intra-disk RAID Solutions for mid-1X TLC NAND Flash Solid State Drives 168
Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off 167
Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays 166
Evidence of erratic behaviors in p-channel floating gate memories and cell architectural solution 165
A scalable bidimensional randomization scheme for tlc 3d nand flash memories 162
Machine Learning and Non-volatile Memories 161
Multilevel HfO2-based RRAM devices for low-power neuromorphic networks 158
Statistical analysis of resistive switching characteristics in ReRAM test arrays 156
Modeling of SET Seasoning Effects in Phase Change Memory Arrays 155
Compact Modeling of Negative Vₜ Shift Disturb in NAND Flash Memories 155
Statistical Modeling of Secondary Path during Erase Operation in Phase Change Memories 154
Uniform and concentrated read disturb effects in mid-1X TLC NAND flash memories for enterprise solid state drives 154
Enabling Computational Storage Through FPGA Neural Network Accelerator for Enterprise SSD 150
SSD reliability assessment and improvement 149
Assessing the role of program suspend operation in 3d nand flash based solid state drives 146
Investigating 3D NAND Flash Read Disturb Reliability with Extreme Value Analysis 143
Exposing Reliability/Performance Trade-Off in Non-Volatile Memories through Erratic Bits Signature Classification 142
Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing 142
The role of the bottom and top interfaces in the 1st reset operation in HfO2 based RRAM devices 138
Experimental characterization of SET Seasoning on Phase Change Memory arrays 138
Modeling 3D NAND Flash with Nonparametric Inference on Regression Coefficients for Reliable Solid-State Storage 137
Low-energy inference machine with multilevel HfO2 RRAM arrays 135
High throughput edit distance computation on FPGA-based accelerators using HLS 134
Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks 128
SSD Reliability 128
Toward Reliable Multi-Level Operation in RRAM Arrays: Improving Post-Algorithm Stability and Assessing Endurance/Data Retention 127
Accurate Program/Verify Schemes of Resistive Switching Memory (RRAM) for In-Memory Neural Network Circuits 124
Totale 23.676
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Categoria #
all - tutte 101.097
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 8.607
Totale 109.704
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021261 0 0 0 0 0 0 0 0 0 0 146 115
2021/20221.220 88 73 67 21 58 93 100 71 67 113 139 330
2022/20231.029 117 10 72 98 99 156 132 95 117 13 88 32
2023/2024521 64 60 16 14 38 47 27 38 12 12 13 180
2024/20253.202 70 150 276 59 317 379 149 252 354 443 519 234
2025/20268.751 675 442 747 1.132 1.445 561 1.077 495 933 1.019 225 0
Totale 27.111