SFERA Archivio dei prodotti della Ricerca dell'Università di Ferrara

ZAMBELLI, Cristian
 Distribuzione geografica
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Continente #
NA - Nord America 11.302
EU - Europa 6.029
AS - Asia 4.663
SA - Sud America 801
AF - Africa 111
Continente sconosciuto - Info sul continente non disponibili 5
OC - Oceania 2
Totale 22.913
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Nazione #
US - Stati Uniti d'America 10.448
PL - Polonia 2.364
SG - Singapore 1.866
CN - Cina 1.338
GB - Regno Unito 899
DE - Germania 888
IT - Italia 885
CA - Canada 728
BR - Brasile 694
HK - Hong Kong 525
UA - Ucraina 305
TR - Turchia 249
VN - Vietnam 235
FI - Finlandia 134
RU - Federazione Russa 127
MX - Messico 103
FR - Francia 102
SE - Svezia 102
ID - Indonesia 93
IN - India 86
NL - Olanda 81
ZA - Sudafrica 60
AR - Argentina 44
AT - Austria 42
JP - Giappone 39
TW - Taiwan 39
ES - Italia 38
KR - Corea 37
BD - Bangladesh 31
IQ - Iraq 22
VE - Venezuela 15
IL - Israele 13
MA - Marocco 13
TN - Tunisia 13
BE - Belgio 12
JO - Giordania 12
LT - Lituania 12
CO - Colombia 11
PK - Pakistan 11
EC - Ecuador 10
NP - Nepal 10
UZ - Uzbekistan 10
PY - Paraguay 9
CZ - Repubblica Ceca 8
KE - Kenya 8
AE - Emirati Arabi Uniti 7
CH - Svizzera 7
SA - Arabia Saudita 6
CL - Cile 5
EG - Egitto 5
EU - Europa 5
PE - Perù 5
SN - Senegal 5
AZ - Azerbaigian 4
BO - Bolivia 4
DO - Repubblica Dominicana 4
HN - Honduras 4
AL - Albania 3
CR - Costa Rica 3
DZ - Algeria 3
IE - Irlanda 3
IR - Iran 3
KG - Kirghizistan 3
KZ - Kazakistan 3
LB - Libano 3
MY - Malesia 3
NO - Norvegia 3
PA - Panama 3
RO - Romania 3
UY - Uruguay 3
AM - Armenia 2
AU - Australia 2
BB - Barbados 2
BG - Bulgaria 2
JM - Giamaica 2
KW - Kuwait 2
LK - Sri Lanka 2
OM - Oman 2
PS - Palestinian Territory 2
PT - Portogallo 2
TT - Trinidad e Tobago 2
AO - Angola 1
BA - Bosnia-Erzegovina 1
BH - Bahrain 1
BN - Brunei Darussalam 1
BY - Bielorussia 1
CI - Costa d'Avorio 1
DM - Dominica 1
EE - Estonia 1
ET - Etiopia 1
GE - Georgia 1
GT - Guatemala 1
GY - Guiana 1
HU - Ungheria 1
LA - Repubblica Popolare Democratica del Laos 1
LV - Lettonia 1
ME - Montenegro 1
NI - Nicaragua 1
RS - Serbia 1
SC - Seychelles 1
Totale 22.912
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Città #
Warsaw 2.360
Fairfield 1.294
Singapore 1.060
Woodbridge 980
Ashburn 958
Houston 675
Montréal 610
Mcallen 592
Munich 582
Seattle 535
Santa Clara 523
Hong Kong 519
Beijing 471
Wilmington 458
Cambridge 414
Ann Arbor 401
Jacksonville 373
Ferrara 326
Chandler 281
Izmir 172
Dallas 159
Milan 145
Nanjing 132
Los Angeles 131
The Dalles 119
Princeton 113
Addison 108
Ho Chi Minh City 99
New York 91
London 86
San Diego 84
Boardman 82
Shanghai 82
Jakarta 76
Mexico City 75
São Paulo 67
Council Bluffs 64
Dearborn 55
Helsinki 53
Chicago 52
Ottawa 52
Settimo Milanese 49
Hanoi 46
Johannesburg 38
Amsterdam 37
Moscow 37
Tianjin 37
Phoenix 36
Redwood City 35
Chennai 34
Nanchang 34
Denver 32
Changsha 31
Vienna 31
Brooklyn 30
Shenyang 28
Tokyo 28
Columbus 27
Falkenstein 27
Montreal 26
Orem 26
Atlanta 25
Boston 25
Des Moines 25
Hefei 25
Hebei 24
Mountain View 24
Falls Church 23
Manchester 23
Norwalk 23
Poplar 23
Stockholm 23
Toronto 23
Dong Ket 22
Nuremberg 22
Rio de Janeiro 22
Taipei 22
Bologna 21
Frankfurt An Der Oder 21
Frankfurt am Main 21
Napoli 21
San Francisco 21
Hangzhou 20
Jiaxing 20
San Jose 20
Guangzhou 18
Brasília 16
The Hague 16
Turku 16
Baghdad 14
Auburn Hills 13
Rome 13
Amman 12
Mumbai 12
Zhengzhou 12
Belo Horizonte 11
Delft 11
Kunming 11
Salt Lake City 11
Secaucus 11
Totale 16.914
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Nome #
Phase Change and Magnetic Memories for Solid-State Drive Applications 2.144
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 479
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 478
RRAM Reliability/Performance Characterization through Array Architectures Investigations 435
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays 381
Automated characterization of TAS-MRAM test arrays 379
Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices 377
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms 372
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance 361
Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays 349
Radiation hard design of HfO2 based 1T1R cells and memory arrays 348
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays 336
Reliability and Cell-to-Cell Variability of TAS-MRAM arrays under cycling conditions 336
ATHENIS_3D: Automotive tested high-voltage and embedded non-volatile integrated SoC platform with 3D technology 329
ELECTRICAL CHARACTERIZATION, PHYSICS, MODELING AND RELIABILITY OF INNOVATIVE NON-VOLATILE MEMORIES 264
SSDExplorer: a Virtual Platform for Performance/Reliability-oriented Fine-Grained Design Space Exploration of Solid State Drives 258
Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays 256
Simulations of the software-defined flash 227
Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance 217
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives 214
System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems 212
A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique 204
LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives 203
Reliability challenges in 3D NAND Flash memories 203
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories 200
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays 196
Fundamental variability limits of filament-based RRAM 191
Analysis of reliability/performance trade-off in Solid State Drives 190
Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays 185
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays 184
Architectural and Integration Options for 3D NAND Flash Memories 184
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM 183
Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-Temperature accelerated tests 183
Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers 181
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives 181
A Statistical Model of Erratic Behaviors in Flash Memory Arrays 180
A Compact Model for Erratic Event Simulation in Flash Memory Arrays 176
A new automated methodology for Random Telegraph Signal identification and characterization: a case study on Phase Change Memory arrays 175
Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions 174
Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs 173
A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis 172
Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization 171
An automated test equipment for characterization of emerging MRAM and RRAM arrays 171
Analysis and Optimization of Erasing Waveform in Phase Change Memory Arrays 169
Bit error rate analysis in Charge Trapping memories for SSD applications 167
A New Analytical Model of the Erasing Operation in Phase Change Memories 167
Characterization of the Over-Erase Algorithm in FN/FN embedded NOR Flash arrays 167
Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays 166
Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices 166
Power-supply impact on the reliability of mid-1X TLC NAND flash memories 165
Reliability of 3D NAND Flash Memories 165
Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories 165
Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage 164
Simulation of SSD’s power consumption 162
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays 162
Reliability and performance characterization of a mems-based non-volatile switch 160
Erratic Bits Classification for Efficient Repair Strategies in Automotive Embedded Flash Memories 159
SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives 158
Characterization of a MEMS-based embedded non volatile memory array for extreme environments 157
Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays 156
Resistive RAM technology for SSDs 156
Limits of sensing and storage electronic components for high-reliable and safety-critical automotive applications 156
SSDExplorer: A virtual platform for SSD simulations 152
About the intrinsic resistance variability in HfO2-based RRAM devices 151
Memory driven design methodologies for optimal SSD performance 150
Resistive RAM endurance: Array-level characterization and correction techniques targeting deep learning applications 150
Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays 149
Simulations of RRAM-based SSDs 149
Impact of the NAND Flash Power Supply on Solid State Drives Reliability and Performance 148
An energy-efficient in-memory computing architecture for survival data analysis based on resistive switching memories 146
Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off 146
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices 146
Statistical Modeling of Secondary Path during Erase Operation in Phase Change Memories 145
Modeling the Endurance Reliability of Intra-disk RAID Solutions for mid-1X TLC NAND Flash Solid State Drives 145
Modeling of SET Seasoning Effects in Phase Change Memory Arrays 142
Statistical analysis of resistive switching characteristics in ReRAM test arrays 141
Design trade-offs for NAND flash-based SSDs 141
Evidence of erratic behaviors in p-channel floating gate memories and cell architectural solution 139
Multilevel HfO2-based RRAM devices for low-power neuromorphic networks 137
Uniform and concentrated read disturb effects in mid-1X TLC NAND flash memories for enterprise solid state drives 134
An HPC Pipeline for Calcium Quantification of Aortic Root From Contrast-Enhanced CCT Scans 132
Exposing Reliability/Performance Trade-Off in Non-Volatile Memories through Erratic Bits Signature Classification 129
SSD reliability assessment and improvement 129
Enabling Computational Storage Through FPGA Neural Network Accelerator for Enterprise SSD 128
Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing 127
Compact Modeling of Negative Vₜ Shift Disturb in NAND Flash Memories 126
A scalable bidimensional randomization scheme for tlc 3d nand flash memories 124
The role of the bottom and top interfaces in the 1st reset operation in HfO2 based RRAM devices 122
Experimental characterization of SET Seasoning on Phase Change Memory arrays 121
Machine Learning and Non-volatile Memories 119
Low-energy inference machine with multilevel HfO2 RRAM arrays 118
SSD Reliability 113
Deep-learning survival analysis for patients with calcific aortic valve disease undergoing valve replacement 112
Toward Reliable Multi-Level Operation in RRAM Arrays: Improving Post-Algorithm Stability and Assessing Endurance/Data Retention 105
Assessing the role of program suspend operation in 3d nand flash based solid state drives 104
Modeling 3D NAND Flash with Nonparametric Inference on Regression Coefficients for Reliable Solid-State Storage 103
null 101
Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks 100
Investigating 3D NAND Flash Read Disturb Reliability with Extreme Value Analysis 99
High throughput edit distance computation on FPGA-based accelerators using HLS 98
Totale 20.820
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Categoria #
all - tutte 93.124
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 8.022
Totale 101.146
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/20211.622 0 0 0 0 0 390 190 269 100 412 146 115
2021/20221.220 88 73 67 21 58 93 100 71 67 113 139 330
2022/20231.029 117 10 72 98 99 156 132 95 117 13 88 32
2023/2024521 64 60 16 14 38 47 27 38 12 12 13 180
2024/20253.202 70 150 276 59 317 379 149 252 354 443 519 234
2025/20264.940 675 442 747 1.132 1.445 499 0 0 0 0 0 0
Totale 23.300