SFERA Archivio dei prodotti della Ricerca dell'Università di Ferrara

OLIVO, Piero
 Distribuzione geografica
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Continente #
NA - Nord America 13.394
EU - Europa 4.977
AS - Asia 1.940
Continente sconosciuto - Info sul continente non disponibili 6
SA - Sud America 3
AF - Africa 2
OC - Oceania 2
Totale 20.324
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Nazione #
US - Stati Uniti d'America 13.212
PL - Polonia 1.996
CN - Cina 1.150
IT - Italia 812
UA - Ucraina 735
DE - Germania 496
GB - Regno Unito 446
TR - Turchia 444
SG - Singapore 227
SE - Svezia 201
CA - Canada 181
FI - Finlandia 161
FR - Francia 38
KR - Corea 37
BE - Belgio 26
AT - Austria 25
ID - Indonesia 19
VN - Vietnam 18
TW - Taiwan 16
NL - Olanda 11
JP - Giappone 9
IL - Israele 7
EU - Europa 6
RU - Federazione Russa 6
CZ - Repubblica Ceca 5
IN - India 5
CH - Svizzera 4
IE - Irlanda 4
ES - Italia 3
HK - Hong Kong 3
RO - Romania 3
AU - Australia 2
BR - Brasile 2
IR - Iran 2
BG - Bulgaria 1
EC - Ecuador 1
EG - Egitto 1
GR - Grecia 1
HU - Ungheria 1
IQ - Iraq 1
LK - Sri Lanka 1
MA - Marocco 1
ME - Montenegro 1
MY - Malesia 1
PA - Panama 1
PT - Portogallo 1
Totale 20.324
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Città #
Fairfield 2.174
Warsaw 1.995
Woodbridge 1.738
Houston 1.283
Ashburn 938
Seattle 887
Jacksonville 850
Ann Arbor 774
Wilmington 758
Cambridge 735
Chandler 622
Izmir 316
Ferrara 300
Nanjing 280
Beijing 209
Princeton 196
Addison 190
Milan 189
San Diego 180
Singapore 125
Boardman 122
Mcallen 113
Montréal 108
Shanghai 83
Nanchang 81
Shenyang 79
Munich 76
Ottawa 70
Changsha 60
Dearborn 59
Jiaxing 53
Hebei 50
Settimo Milanese 44
Tianjin 44
San Mateo 39
Redwood City 38
Falls Church 36
London 36
Norwalk 32
Jinan 31
Auburn Hills 27
Mountain View 26
Hangzhou 24
Los Angeles 24
Brussels 23
Des Moines 23
Vienna 22
Frankfurt An Der Oder 21
Napoli 21
Jakarta 19
Ningbo 19
Zhengzhou 19
Dong Ket 17
Kunming 17
Guangzhou 16
Bologna 15
Orange 15
Verona 15
Helsinki 13
Chicago 12
Philadelphia 12
Indiana 11
Lanzhou 10
Phoenix 10
Redmond 9
Xian 9
New York 8
Taipei 8
Changchun 7
Hounslow 7
Taizhou 7
Hefei 6
Seoul 6
Washington 6
Bielefeld 5
Clifton 5
Gif-sur-yvette 5
Tappahannock 5
Tokyo 5
Acton 4
Delft 4
Haikou 4
Kidron 4
Kilburn 4
Paris 4
Simi Valley 4
Taiyuan 4
Wuhan 4
Yellow Springs 4
Amsterdam 3
Benevento 3
Dresden 3
Fuzhou 3
Herent 3
Monza 3
Münster 3
Palermo 3
Santa Clara 3
Southwark 3
Tel Aviv 3
Totale 16.595
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Nome #
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 415
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 415
RRAM Reliability/Performance Characterization through Array Architectures Investigations 386
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays 315
Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices 309
Automated characterization of TAS-MRAM test arrays 305
Radiation hard design of HfO2 based 1T1R cells and memory arrays 303
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms 297
Reliability and Cell-to-Cell Variability of TAS-MRAM arrays under cycling conditions 291
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays 289
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance 285
Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays 284
SSDExplorer: a Virtual Platform for Performance/Reliability-oriented Fine-Grained Design Space Exploration of Solid State Drives 179
Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays 170
Reliability challenges in 3D NAND Flash memories 166
Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance 145
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives 135
System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems 133
null 133
Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-Temperature accelerated tests 127
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories 124
Characterization of flash structures erased with ultra-short pulses 123
Characterization of the Over-Erase Algorithm in FN/FN embedded NOR Flash arrays 123
Constant charge erasing scheme for Flash Memories 122
Quantum Effects in Accumulation Layers of Si-SiO2 Interfaces in the WKB Effective Mass Approximation 121
Overerase Phenomena: An Insight into Flash memory Reliability 121
Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers 120
Fundamental variability limits of filament-based RRAM 120
Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization 120
Statistical Methodologies for Integrated Circuits Design 119
Hot Electrons in MOS Transistors: Lateral Distribution of the Trapped Oxide Charge 119
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays 119
Correlated Fluctuations and Noise Spectra of Tunneling and Substrate Currents Before Breakdown in Thin-Oxide MOS Devices 119
Impact of Pulsed Operation on Performance and Reliability of Flash Memories 118
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays 118
Simulations of the software-defined flash 118
Electron trapping/detrapping within thin SiO2 films in the high field tunneling regime 117
Bit error rate analysis in Charge Trapping memories for SSD applications 117
Threshold voltage spread in Flash memories under a constant DQ erasing scheme 117
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM 116
Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage 115
Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices 115
Quantum effects in accumulated MOS thin dielectric structures 113
A BIST Scheme for Non-Volatile Memories 113
Erratic bits in flash memories under Fowler-Nordheim programming 112
Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions 112
Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays 112
A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique 111
LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives 111
Power-supply impact on the reliability of mid-1X TLC NAND flash memories 111
Low-Frequency Noise in Silicon-Gate Metal-Oxide-Silicon Capacitors Before Oxide Breakdown 109
Reliability and performance characterization of a mems-based non-volatile switch 109
Analysis of reliability/performance trade-off in Solid State Drives 109
Reliability of 3D NAND Flash Memories 108
Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs 108
Characterization of a MEMS-based embedded non volatile memory array for extreme environments 108
Dielectric reliability for future logic and Non-Volatile Memory applications: a statistical simulation analysis approach 107
Limits of sensing and storage electronic components for high-reliable and safety-critical automotive applications 107
SSDExplorer: A virtual platform for SSD simulations 107
Two-Dimensional Effects in Hot-Electron Modified MOSFET's 106
Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays 106
Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays 106
Erratic Bits Classification for Efficient Repair Strategies in Automotive Embedded Flash Memories 106
Architectural and Integration Options for 3D NAND Flash Memories 106
A Probabilistic Fault Model for “Analog” Faults in Digital CMOS Circuits 106
Fault Simulation for General FCMOS ICs 105
Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off 105
SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives 105
Modeling the Endurance Reliability of Intra-disk RAID Solutions for mid-1X TLC NAND Flash Solid State Drives 105
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays 105
Testing of E2PROM Aging and Endurance: a Case Study 104
A Statistical Model of Erratic Behaviors in Flash Memory Arrays 104
Statistical analysis of resistive switching characteristics in ReRAM test arrays 104
High-Field-Induced Voltage-Dependent Oxide-Charge 104
Resistive RAM technology for SSDs 104
Reliability of erasing operation in NOR-Flash memories 103
Evidence of the Role of Defects Near the Injecting Interface in Determining SiO2 Breakdown 103
A new failure mode of very thin (< 50 A) Thermal SiO2 Films 102
Testability Measures in Pseudorandom Testing 102
Aliasing in Signature Analysis Testing with Multiple-Input Shift-Registers 101
Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays 101
null 101
Analysis of Resistive Bridging Fault Detection in BiCMOS Digital ICs 100
Improving performance and reliability of NOR-Flash arrays by using pulsed operation 100
Reliability Evaluation of Combinational Logic Circuits by Symbolic Simulation 100
Design of CMOS Checkers with Improved Testability of Bridging and Transistor Stuck-on Faults 100
Fault Simulation of Parametric Bridging Faults in CMOS ICs 100
A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis 100
Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories 100
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives 100
Temperature Dependence of Fowler-Nordheim Injection from Accumulated n-type Silicon into Silicon Dioxide 100
Dynamic Effects in the Detection of Bridging Faults in CMOS ICs 100
Self-Consistent Solution of Poisson and Schrodinger Equations in Accumulated Semiconductor-Insulator Interfaces 99
Transient simulation of the erase cycle of floating gate EEPROMs 99
Self-Learning Signature analysis for non-volatile memory testing 99
Flash Memory Cells- An Overview 99
Charge trapping and retention in ultra-thin oxide-nitride-oxide structures 99
Simulation of SSD’s power consumption 99
Impact of Tunnel Oxide Thickness on Erratic Erase in Flash Memories 99
Multilevel HfO2-based RRAM devices for low-power neuromorphic networks 99
Totale 13.756
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Categoria #
all - tutte 75.317
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 5.881
Totale 81.198
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20205.515 847 224 285 779 405 571 534 503 477 506 215 169
2020/20213.545 317 322 224 366 168 458 201 388 103 539 279 180
2021/20222.125 106 146 157 44 169 126 126 107 116 166 199 663
2022/20231.755 207 17 82 183 230 289 174 167 213 10 139 44
2023/2024721 105 108 21 28 50 38 27 51 17 24 10 242
2024/202581 81 0 0 0 0 0 0 0 0 0 0 0
Totale 20.646