SFERA Archivio dei prodotti della Ricerca dell'Università di Ferrara

OLIVO, Piero
 Distribuzione geografica
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Continente #
NA - Nord America 18.673
AS - Asia 8.875
EU - Europa 6.384
SA - Sud America 1.408
AF - Africa 217
Continente sconosciuto - Info sul continente non disponibili 9
OC - Oceania 5
AN - Antartide 1
Totale 35.572
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Nazione #
US - Stati Uniti d'America 18.170
SG - Singapore 3.317
CN - Cina 2.366
PL - Polonia 2.059
BR - Brasile 1.134
IT - Italia 934
VN - Vietnam 877
HK - Hong Kong 829
UA - Ucraina 799
DE - Germania 687
GB - Regno Unito 630
TR - Turchia 508
CA - Canada 286
FR - Francia 267
FI - Finlandia 255
SE - Svezia 236
JP - Giappone 208
RU - Federazione Russa 205
MX - Messico 156
IN - India 147
BD - Bangladesh 118
ID - Indonesia 100
NL - Olanda 98
AR - Argentina 97
ZA - Sudafrica 89
ES - Italia 55
IQ - Iraq 55
KR - Corea 50
PK - Pakistan 44
CO - Colombia 40
EC - Ecuador 40
AT - Austria 38
VE - Venezuela 36
TW - Taiwan 35
MA - Marocco 31
BE - Belgio 29
UZ - Uzbekistan 26
PH - Filippine 22
PY - Paraguay 22
MY - Malesia 21
SA - Arabia Saudita 19
TN - Tunisia 19
JO - Giordania 18
CL - Cile 17
KE - Kenya 16
NP - Nepal 16
AE - Emirati Arabi Uniti 15
LT - Lituania 14
CZ - Repubblica Ceca 13
IL - Israele 13
CR - Costa Rica 12
EG - Egitto 12
AZ - Azerbaigian 11
DZ - Algeria 11
BO - Bolivia 10
CH - Svizzera 10
DO - Repubblica Dominicana 10
IE - Irlanda 10
SN - Senegal 10
KZ - Kazakistan 9
LB - Libano 9
PE - Perù 9
ET - Etiopia 8
JM - Giamaica 8
EU - Europa 6
GR - Grecia 6
OM - Oman 6
AL - Albania 5
AO - Angola 5
AU - Australia 5
GT - Guatemala 5
HN - Honduras 5
NI - Nicaragua 5
PA - Panama 5
PS - Palestinian Territory 5
SY - Repubblica araba siriana 5
GD - Grenada 4
HU - Ungheria 4
KG - Kirghizistan 4
PT - Portogallo 4
RO - Romania 4
TH - Thailandia 4
AM - Armenia 3
BA - Bosnia-Erzegovina 3
GE - Georgia 3
LV - Lettonia 3
RS - Serbia 3
TT - Trinidad e Tobago 3
XK - ???statistics.table.value.countryCode.XK??? 3
BB - Barbados 2
BG - Bulgaria 2
CI - Costa d'Avorio 2
EE - Estonia 2
GH - Ghana 2
IR - Iran 2
KW - Kuwait 2
MK - Macedonia 2
MU - Mauritius 2
NG - Nigeria 2
NO - Norvegia 2
Totale 35.545
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Città #
Fairfield 2.175
Singapore 2.124
Warsaw 2.049
Woodbridge 1.738
Ashburn 1.695
Houston 1.301
San Jose 1.053
Seattle 900
Jacksonville 855
Santa Clara 810
Hong Kong 799
Ann Arbor 774
Wilmington 765
Cambridge 735
Beijing 710
Chandler 622
Izmir 319
Ho Chi Minh City 317
Ferrara 309
Nanjing 281
Hanoi 213
Milan 198
Princeton 196
Tokyo 196
Addison 190
Los Angeles 188
San Diego 180
Lauterbourg 174
Dallas 155
New York 144
The Dalles 138
Munich 135
Boardman 122
Mcallen 113
Mexico City 111
London 109
Montréal 108
São Paulo 104
Shanghai 99
Council Bluffs 96
Chicago 89
Helsinki 88
Nanchang 81
Shenyang 79
Ottawa 75
Orem 66
Jakarta 65
Changsha 63
Dearborn 60
Tianjin 58
Hefei 53
Jiaxing 53
Moscow 52
Hebei 50
Brooklyn 46
Amsterdam 45
Johannesburg 45
Settimo Milanese 44
Atlanta 43
Chennai 42
Da Nang 41
Phoenix 39
Redwood City 39
San Mateo 39
Montreal 38
Denver 37
Rio de Janeiro 37
Falls Church 36
Hangzhou 36
San Francisco 35
Haiphong 34
Stockholm 34
Jinan 32
Norwalk 32
Manchester 31
Boston 29
Frankfurt am Main 29
Vienna 29
Des Moines 28
Poplar 28
Auburn Hills 27
Columbus 27
Bologna 26
Mountain View 26
Toronto 26
Brussels 25
Falkenstein 25
Belo Horizonte 22
Brasília 22
Guangzhou 22
Tashkent 22
Frankfurt An Der Oder 21
Napoli 21
Baghdad 20
Dhaka 20
Zhengzhou 20
Ningbo 19
Nuremberg 19
The Hague 18
Amman 17
Totale 25.625
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Nome #
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 508
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 499
RRAM Reliability/Performance Characterization through Array Architectures Investigations 472
Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices 418
Automated characterization of TAS-MRAM test arrays 412
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays 410
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms 407
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance 400
Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays 380
Radiation hard design of HfO2 based 1T1R cells and memory arrays 368
Reliability and Cell-to-Cell Variability of TAS-MRAM arrays under cycling conditions 368
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays 362
SSDExplorer: a Virtual Platform for Performance/Reliability-oriented Fine-Grained Design Space Exploration of Solid State Drives 321
Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays 312
Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance 288
Simulations of the software-defined flash 256
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives 251
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM 248
System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems 245
LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives 239
A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique 237
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays 234
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives 229
Architectural and Integration Options for 3D NAND Flash Memories 227
Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers 226
A Probabilistic Fault Model for “Analog” Faults in Digital CMOS Circuits 226
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories 223
Constant charge erasing scheme for Flash Memories 220
Reliability challenges in 3D NAND Flash memories 220
A Statistical Model of Erratic Behaviors in Flash Memory Arrays 219
Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays 217
Fundamental variability limits of filament-based RRAM 216
Analysis of reliability/performance trade-off in Solid State Drives 216
A Compact Model for Erratic Event Simulation in Flash Memory Arrays 213
Dielectric reliability for future logic and Non-Volatile Memory applications: a statistical simulation analysis approach 213
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays 213
A new automated methodology for Random Telegraph Signal identification and characterization: a case study on Phase Change Memory arrays 212
An automated test equipment for characterization of emerging MRAM and RRAM arrays 212
Erratic bits in flash memories under Fowler-Nordheim programming 209
Simulation of SSD’s power consumption 209
Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-Temperature accelerated tests 206
Overerase Phenomena: An Insight into Flash memory Reliability 205
A BIST Scheme for Non-Volatile Memories 204
A new failure mode of very thin (< 50 A) Thermal SiO2 Films 204
Aliasing in Signature Analysis Testing with Multiple-Input Shift-Registers 203
A New Analytical Model of the Erasing Operation in Phase Change Memories 201
Statistical Methodologies for Integrated Circuits Design 200
Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs 200
Threshold voltage spread in Flash memories under a constant DQ erasing scheme 198
Analysis and Optimization of Erasing Waveform in Phase Change Memory Arrays 198
A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis 198
Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions 197
Advanced Electrical-Level Modeling of EEPROM Cells 197
Reliability of 3D NAND Flash Memories 197
An Analytical Model for the Aliasing Probability in Signature Analysis Testing 195
Impact of Pulsed Operation on Performance and Reliability of Flash Memories 195
Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization 194
Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories 193
An energy-efficient in-memory computing architecture for survival data analysis based on resistive switching memories 191
Bit error rate analysis in Charge Trapping memories for SSD applications 191
Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays 191
Power-supply impact on the reliability of mid-1X TLC NAND flash memories 190
Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage 190
Characterization of the Over-Erase Algorithm in FN/FN embedded NOR Flash arrays 190
SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives 186
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays 186
Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices 186
Impact of the NAND Flash Power Supply on Solid State Drives Reliability and Performance 186
Erratic bits in Flash memories under Fowler-Nordheim programming 184
A Novel Critical Path Heuristic for Fast Fault Grading 184
Characterization of flash structures erased with ultra-short pulses 183
Hot Electrons in MOS Transistors: Lateral Distribution of the Trapped Oxide Charge 183
Resistive RAM technology for SSDs 182
Analysis of Erratic Bits in FLASH Memories 179
Reliability and performance characterization of a mems-based non-volatile switch 179
Simulations of RRAM-based SSDs 179
Characterization of a MEMS-based embedded non volatile memory array for extreme environments 179
Quantum Effects in Accumulation Layers of Si-SiO2 Interfaces in the WKB Effective Mass Approximation 178
Dynamics of Fast-Erasing Bits in Flash Memories 177
Automated Test Equipment for research on Non volatile memories 176
Erratic Bits Classification for Efficient Repair Strategies in Automotive Embedded Flash Memories 176
Limits of sensing and storage electronic components for high-reliable and safety-critical automotive applications 176
Advanced spice-like modeling of E2PROM cells 175
Analysis of Erratic Bits in Flash Memories 175
SSDExplorer: A virtual platform for SSD simulations 175
Correlated Fluctuations and Noise Spectra of Tunneling and Substrate Currents Before Breakdown in Thin-Oxide MOS Devices 175
Electron trapping/detrapping within thin SiO2 films in the high field tunneling regime 174
Threshold voltage spread in Flash memories under a constant DQ erasing scheme 171
Correlation between IDDQ Testing Quality and Sensor Accuracy 170
Memory driven design methodologies for optimal SSD performance 170
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices 170
Affidabilità di sistemi wireless 169
Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off 169
Design trade-offs for NAND flash-based SSDs 169
Low-Frequency Noise in Silicon-Gate Metal-Oxide-Silicon Capacitors Before Oxide Breakdown 168
Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays 168
Modeling the Endurance Reliability of Intra-disk RAID Solutions for mid-1X TLC NAND Flash Solid State Drives 168
Testing of E2PROM Aging and Endurance: a Case Study 167
Two-Dimensional Effects in Hot-Electron Modified MOSFET's 166
Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays 166
Totale 22.607
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Categoria #
all - tutte 151.445
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 12.181
Totale 163.626
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021180 0 0 0 0 0 0 0 0 0 0 0 180
2021/20222.125 106 146 157 44 169 126 126 107 116 166 199 663
2022/20231.755 207 17 82 183 230 289 174 167 213 10 139 44
2023/2024721 105 108 21 28 50 38 27 51 17 24 10 242
2024/20254.159 92 181 356 55 451 503 181 316 487 574 653 310
2025/202611.178 924 546 989 1.471 1.773 692 1.315 566 1.106 1.273 368 155
Totale 35.902