SFERA Archivio dei prodotti della Ricerca dell'Università di Ferrara

OLIVO, Piero
 Distribuzione geografica
Salva come PNG Salva come JPEG
Continente #
NA - Nord America 16.673
AS - Asia 6.692
EU - Europa 6.003
SA - Sud America 1.159
AF - Africa 127
Continente sconosciuto - Info sul continente non disponibili 8
OC - Oceania 3
AN - Antartide 1
Totale 30.666
Salva come PNG Salva come JPEG
Nazione #
US - Stati Uniti d'America 16.233
SG - Singapore 2.677
PL - Polonia 2.056
CN - Cina 2.049
BR - Brasile 1.007
IT - Italia 893
UA - Ucraina 791
HK - Hong Kong 742
DE - Germania 662
GB - Regno Unito 608
TR - Turchia 466
VN - Vietnam 299
CA - Canada 264
SE - Svezia 234
FI - Finlandia 230
RU - Federazione Russa 194
MX - Messico 139
ID - Indonesia 80
FR - Francia 78
IN - India 77
NL - Olanda 77
AR - Argentina 65
ZA - Sudafrica 65
ES - Italia 47
JP - Giappone 44
BD - Bangladesh 42
KR - Corea 40
AT - Austria 35
BE - Belgio 29
TW - Taiwan 29
IQ - Iraq 26
MA - Marocco 19
PY - Paraguay 19
EC - Ecuador 17
VE - Venezuela 17
PK - Pakistan 16
CO - Colombia 15
IL - Israele 13
JO - Giordania 13
LT - Lituania 13
UZ - Uzbekistan 13
CZ - Repubblica Ceca 12
AE - Emirati Arabi Uniti 11
NP - Nepal 11
TN - Tunisia 10
CH - Svizzera 8
KE - Kenya 8
IE - Irlanda 7
CL - Cile 6
DO - Repubblica Dominicana 6
DZ - Algeria 6
EG - Egitto 6
EU - Europa 6
SA - Arabia Saudita 6
SN - Senegal 6
AZ - Azerbaigian 5
BO - Bolivia 5
GR - Grecia 5
GT - Guatemala 5
HN - Honduras 5
LB - Libano 5
PE - Perù 5
CR - Costa Rica 4
JM - Giamaica 4
KZ - Kazakistan 4
AU - Australia 3
GD - Grenada 3
KG - Kirghizistan 3
PA - Panama 3
PT - Portogallo 3
RO - Romania 3
TT - Trinidad e Tobago 3
AL - Albania 2
AM - Armenia 2
AO - Angola 2
BA - Bosnia-Erzegovina 2
BB - Barbados 2
BG - Bulgaria 2
ET - Etiopia 2
HU - Ungheria 2
IR - Iran 2
KW - Kuwait 2
LV - Lettonia 2
MK - Macedonia 2
NO - Norvegia 2
PS - Palestinian Territory 2
SK - Slovacchia (Repubblica Slovacca) 2
SY - Repubblica araba siriana 2
UY - Uruguay 2
XK - ???statistics.table.value.countryCode.XK??? 2
AQ - Antartide 1
BH - Bahrain 1
BN - Brunei Darussalam 1
CI - Costa d'Avorio 1
CY - Cipro 1
EE - Estonia 1
GE - Georgia 1
GY - Guiana 1
KY - Cayman, isole 1
LA - Repubblica Popolare Democratica del Laos 1
Totale 30.656
Salva come PNG Salva come JPEG
Città #
Fairfield 2.174
Warsaw 2.048
Woodbridge 1.738
Singapore 1.569
Ashburn 1.341
Houston 1.296
Seattle 897
Jacksonville 852
Ann Arbor 774
Santa Clara 772
Wilmington 762
Hong Kong 736
Cambridge 735
Beijing 643
Chandler 622
Izmir 317
Ferrara 307
Nanjing 280
Milan 196
Princeton 196
Addison 190
San Diego 180
Los Angeles 171
Munich 135
Dallas 130
Ho Chi Minh City 129
Boardman 122
The Dalles 119
Mcallen 113
Montréal 108
Mexico City 105
London 103
New York 100
Shanghai 96
São Paulo 95
Nanchang 81
Shenyang 79
Chicago 76
Ottawa 75
Council Bluffs 70
Helsinki 65
Hanoi 64
Jakarta 63
Changsha 62
Dearborn 59
Tianjin 57
Jiaxing 53
Hefei 51
Hebei 50
Moscow 49
Settimo Milanese 44
Brooklyn 42
San Mateo 39
Amsterdam 38
Redwood City 38
Tokyo 38
Falls Church 36
Orem 36
Johannesburg 35
Montreal 35
Phoenix 35
Rio de Janeiro 35
Denver 33
Stockholm 33
Jinan 32
Norwalk 32
Atlanta 30
Boston 28
Chennai 28
Hangzhou 28
Poplar 28
San Jose 28
Vienna 28
Auburn Hills 27
San Francisco 27
Columbus 26
Des Moines 26
Mountain View 26
Brussels 25
Falkenstein 25
Manchester 24
Belo Horizonte 21
Frankfurt An Der Oder 21
Frankfurt am Main 21
Napoli 21
Toronto 21
Bologna 20
Brasília 20
Guangzhou 20
Ningbo 19
Zhengzhou 19
Dong Ket 17
Kunming 17
Philadelphia 16
The Hague 16
Orange 15
Taipei 15
Turku 15
Verona 15
Curitiba 14
Totale 22.433
Salva come PNG Salva come JPEG
Nome #
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 479
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 478
RRAM Reliability/Performance Characterization through Array Architectures Investigations 435
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays 381
Automated characterization of TAS-MRAM test arrays 379
Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices 377
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms 372
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance 360
Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays 349
Radiation hard design of HfO2 based 1T1R cells and memory arrays 348
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays 336
Reliability and Cell-to-Cell Variability of TAS-MRAM arrays under cycling conditions 336
SSDExplorer: a Virtual Platform for Performance/Reliability-oriented Fine-Grained Design Space Exploration of Solid State Drives 258
Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays 256
Simulations of the software-defined flash 226
Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance 216
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives 214
System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems 212
A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique 203
LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives 203
Reliability challenges in 3D NAND Flash memories 203
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories 199
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays 196
Fundamental variability limits of filament-based RRAM 191
Constant charge erasing scheme for Flash Memories 189
Analysis of reliability/performance trade-off in Solid State Drives 189
A Probabilistic Fault Model for “Analog” Faults in Digital CMOS Circuits 186
Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays 185
Threshold voltage spread in Flash memories under a constant DQ erasing scheme 185
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays 184
Architectural and Integration Options for 3D NAND Flash Memories 183
Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-Temperature accelerated tests 183
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM 182
Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers 181
Dielectric reliability for future logic and Non-Volatile Memory applications: a statistical simulation analysis approach 181
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives 181
Erratic bits in flash memories under Fowler-Nordheim programming 180
A Statistical Model of Erratic Behaviors in Flash Memory Arrays 179
Overerase Phenomena: An Insight into Flash memory Reliability 178
A BIST Scheme for Non-Volatile Memories 176
Statistical Methodologies for Integrated Circuits Design 175
A Compact Model for Erratic Event Simulation in Flash Memory Arrays 175
Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions 174
A new automated methodology for Random Telegraph Signal identification and characterization: a case study on Phase Change Memory arrays 173
Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs 173
A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis 172
Impact of Pulsed Operation on Performance and Reliability of Flash Memories 171
Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization 171
A new failure mode of very thin (< 50 A) Thermal SiO2 Films 171
Aliasing in Signature Analysis Testing with Multiple-Input Shift-Registers 170
An automated test equipment for characterization of emerging MRAM and RRAM arrays 170
Analysis and Optimization of Erasing Waveform in Phase Change Memory Arrays 168
Bit error rate analysis in Charge Trapping memories for SSD applications 167
Characterization of the Over-Erase Algorithm in FN/FN embedded NOR Flash arrays 167
Erratic bits in Flash memories under Fowler-Nordheim programming 166
A New Analytical Model of the Erasing Operation in Phase Change Memories 166
Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays 166
Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices 166
An Analytical Model for the Aliasing Probability in Signature Analysis Testing 165
Characterization of flash structures erased with ultra-short pulses 165
Power-supply impact on the reliability of mid-1X TLC NAND flash memories 165
Reliability of 3D NAND Flash Memories 165
Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories 165
Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage 164
Advanced Electrical-Level Modeling of EEPROM Cells 163
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays 162
Quantum Effects in Accumulation Layers of Si-SiO2 Interfaces in the WKB Effective Mass Approximation 161
Simulation of SSD’s power consumption 161
Correlated Fluctuations and Noise Spectra of Tunneling and Substrate Currents Before Breakdown in Thin-Oxide MOS Devices 161
Reliability and performance characterization of a mems-based non-volatile switch 160
Hot Electrons in MOS Transistors: Lateral Distribution of the Trapped Oxide Charge 160
Automated Test Equipment for research on Non volatile memories 159
Erratic Bits Classification for Efficient Repair Strategies in Automotive Embedded Flash Memories 159
SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives 158
Electron trapping/detrapping within thin SiO2 films in the high field tunneling regime 157
Dynamics of Fast-Erasing Bits in Flash Memories 157
Analysis of Erratic Bits in FLASH Memories 157
Characterization of a MEMS-based embedded non volatile memory array for extreme environments 157
Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays 156
Resistive RAM technology for SSDs 156
Limits of sensing and storage electronic components for high-reliable and safety-critical automotive applications 156
Analysis of Erratic Bits in Flash Memories 155
A Novel Critical Path Heuristic for Fast Fault Grading 154
Reliability of erasing operation in NOR-Flash memories 150
Threshold voltage spread in Flash memories under a constant DQ erasing scheme 150
SSDExplorer: A virtual platform for SSD simulations 150
Memory driven design methodologies for optimal SSD performance 150
Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays 149
Simulations of RRAM-based SSDs 149
Quantum effects in accumulated MOS thin dielectric structures 148
Impact of the NAND Flash Power Supply on Solid State Drives Reliability and Performance 148
Testing of E2PROM Aging and Endurance: a Case Study 147
Two-Dimensional Effects in Hot-Electron Modified MOSFET's 146
Low-Frequency Noise in Silicon-Gate Metal-Oxide-Silicon Capacitors Before Oxide Breakdown 146
Fault Simulation for General FCMOS ICs 146
Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off 146
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices 146
An energy-efficient in-memory computing architecture for survival data analysis based on resistive switching memories 145
Correlation between IDDQ Testing Quality and Sensor Accuracy 145
Reliability Evaluation of Combinational Logic Circuits by Symbolic Simulation 145
Totale 19.694
Salva come PNG Salva come JPEG
Categoria #
all - tutte 135.827
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 10.873
Totale 146.700
Salva come PNG Salva come JPEG


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/20212.148 0 0 0 0 0 458 201 388 103 539 279 180
2021/20222.125 106 146 157 44 169 126 126 107 116 166 199 663
2022/20231.755 207 17 82 183 230 289 174 167 213 10 139 44
2023/2024721 105 108 21 28 50 38 27 51 17 24 10 242
2024/20254.159 92 181 356 55 451 503 181 316 487 574 653 310
2025/20266.270 924 546 989 1.471 1.773 567 0 0 0 0 0 0
Totale 30.994