SFERA Archivio dei prodotti della Ricerca dell'Università di Ferrara

OLIVO, Piero
 Distribuzione geografica
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Continente #
NA - Nord America 20.649
AS - Asia 8.990
EU - Europa 6.549
SA - Sud America 1.460
Continente sconosciuto - Info sul continente non disponibili 340
AF - Africa 217
OC - Oceania 7
AN - Antartide 1
Totale 38.213
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Nazione #
US - Stati Uniti d'America 20.054
SG - Singapore 3.341
CN - Cina 2.402
PL - Polonia 2.061
BR - Brasile 1.160
IT - Italia 1.020
VN - Vietnam 879
HK - Hong Kong 847
UA - Ucraina 799
DE - Germania 697
GB - Regno Unito 651
TR - Turchia 509
CA - Canada 325
FR - Francia 272
FI - Finlandia 255
SE - Svezia 251
JP - Giappone 211
RU - Federazione Russa 205
MX - Messico 163
IN - India 149
BD - Bangladesh 124
ID - Indonesia 108
AR - Argentina 103
NL - Olanda 100
ZA - Sudafrica 89
ES - Italia 59
IQ - Iraq 55
KR - Corea 53
CO - Colombia 52
PK - Pakistan 45
EC - Ecuador 44
AT - Austria 38
VE - Venezuela 36
TW - Taiwan 35
MA - Marocco 31
BE - Belgio 29
UZ - Uzbekistan 26
MY - Malesia 25
CR - Costa Rica 23
PH - Filippine 22
PY - Paraguay 22
CL - Cile 20
SA - Arabia Saudita 20
TN - Tunisia 19
JM - Giamaica 18
JO - Giordania 18
NP - Nepal 18
GT - Guatemala 16
KE - Kenya 16
LT - Lituania 16
AE - Emirati Arabi Uniti 15
IL - Israele 14
CZ - Repubblica Ceca 13
IE - Irlanda 13
EG - Egitto 12
AZ - Azerbaigian 11
DO - Repubblica Dominicana 11
DZ - Algeria 11
HN - Honduras 11
BO - Bolivia 10
CH - Svizzera 10
LB - Libano 10
SN - Senegal 10
IS - Islanda 9
KZ - Kazakistan 9
PE - Perù 9
ET - Etiopia 8
NI - Nicaragua 8
AU - Australia 7
AL - Albania 6
EE - Estonia 6
EU - Europa 6
GR - Grecia 6
OM - Oman 6
AO - Angola 5
KG - Kirghizistan 5
PA - Panama 5
PS - Palestinian Territory 5
SY - Repubblica araba siriana 5
TH - Thailandia 5
GD - Grenada 4
HU - Ungheria 4
PT - Portogallo 4
RO - Romania 4
TT - Trinidad e Tobago 4
AM - Armenia 3
BA - Bosnia-Erzegovina 3
GE - Georgia 3
LV - Lettonia 3
MK - Macedonia 3
RS - Serbia 3
XK - ???statistics.table.value.countryCode.XK??? 3
BB - Barbados 2
BG - Bulgaria 2
CI - Costa d'Avorio 2
GH - Ghana 2
GY - Guiana 2
IR - Iran 2
KW - Kuwait 2
MU - Mauritius 2
Totale 37.849
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Città #
Fairfield 2.176
Singapore 2.134
Warsaw 2.052
Ashburn 1.936
Woodbridge 1.738
Houston 1.307
San Jose 1.255
Seattle 901
Santa Clara 885
Jacksonville 861
Hong Kong 816
Ann Arbor 775
Wilmington 766
Cambridge 737
Beijing 730
Chandler 622
Council Bluffs 520
Izmir 320
Ho Chi Minh City 317
Ferrara 311
Nanjing 281
Milan 223
Hanoi 213
Los Angeles 209
Princeton 197
Tokyo 196
Addison 190
San Diego 183
Lauterbourg 174
Dallas 162
New York 151
The Dalles 138
Munich 136
Boardman 123
Mexico City 116
Mcallen 113
London 111
Montréal 108
São Paulo 106
Chicago 100
Shanghai 100
Helsinki 88
Nanchang 81
Shenyang 79
Phoenix 77
Ottawa 76
Orem 68
Jakarta 65
Changsha 63
Dearborn 60
Tianjin 58
Atlanta 56
Hefei 53
Jiaxing 53
Brooklyn 52
Moscow 52
Hebei 50
Amsterdam 45
Johannesburg 45
Settimo Milanese 44
Chennai 42
Da Nang 41
Denver 40
Montreal 40
Redwood City 39
San Mateo 39
San Francisco 38
Toronto 38
Rio de Janeiro 37
Falls Church 36
Hangzhou 36
Haiphong 34
Stockholm 34
Norwalk 33
Jinan 32
Manchester 32
Columbus 31
Frankfurt am Main 31
Boston 30
Brasília 30
Des Moines 29
Vienna 29
Auburn Hills 28
Poplar 28
Bologna 27
Mountain View 26
Brussels 25
Falkenstein 25
Washington 25
Rome 24
Belo Horizonte 22
Guangzhou 22
Tashkent 22
Frankfurt An Der Oder 21
Napoli 21
Baghdad 20
Dhaka 20
Philadelphia 20
The Hague 20
Zhengzhou 20
Totale 26.841
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Nome #
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 513
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 513
RRAM Reliability/Performance Characterization through Array Architectures Investigations 485
Reduction of the Cell-to-Cell Variability in Hf1-xAlxOy Based RRAM Arrays by Using Program Algorithms 434
Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices 430
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays 427
Automated characterization of TAS-MRAM test arrays 424
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance 417
Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays 399
Reliability and Cell-to-Cell Variability of TAS-MRAM arrays under cycling conditions 383
Radiation hard design of HfO2 based 1T1R cells and memory arrays 379
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays 370
SSDExplorer: a Virtual Platform for Performance/Reliability-oriented Fine-Grained Design Space Exploration of Solid State Drives 343
Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays 326
Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance 323
Simulations of the software-defined flash 268
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives 264
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM 259
LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives 258
System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems 257
A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique 253
Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers 252
A Probabilistic Fault Model for “Analog” Faults in Digital CMOS Circuits 249
Architectural and Integration Options for 3D NAND Flash Memories 245
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives 245
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays 243
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories 238
Reliability challenges in 3D NAND Flash memories 234
A Statistical Model of Erratic Behaviors in Flash Memory Arrays 232
Analysis of reliability/performance trade-off in Solid State Drives 229
Constant charge erasing scheme for Flash Memories 228
Fundamental variability limits of filament-based RRAM 228
Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-Temperature accelerated tests 228
Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays 227
Dielectric reliability for future logic and Non-Volatile Memory applications: a statistical simulation analysis approach 227
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays 225
An automated test equipment for characterization of emerging MRAM and RRAM arrays 225
Simulation of SSD’s power consumption 223
Overerase Phenomena: An Insight into Flash memory Reliability 221
A new automated methodology for Random Telegraph Signal identification and characterization: a case study on Phase Change Memory arrays 221
A Compact Model for Erratic Event Simulation in Flash Memory Arrays 220
Erratic bits in flash memories under Fowler-Nordheim programming 219
A BIST Scheme for Non-Volatile Memories 218
A New Analytical Model of the Erasing Operation in Phase Change Memories 217
Advanced Electrical-Level Modeling of EEPROM Cells 215
A new failure mode of very thin (< 50 A) Thermal SiO2 Films 215
Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs 215
An energy-efficient in-memory computing architecture for survival data analysis based on resistive switching memories 214
Threshold voltage spread in Flash memories under a constant DQ erasing scheme 214
A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis 212
Aliasing in Signature Analysis Testing with Multiple-Input Shift-Registers 211
Analysis and Optimization of Erasing Waveform in Phase Change Memory Arrays 211
Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories 211
Statistical Methodologies for Integrated Circuits Design 210
Reliability of 3D NAND Flash Memories 208
Characterization of the interface-driven 1st Reset operation in HfO2-based 1T1R RRAM devices 208
An Analytical Model for the Aliasing Probability in Signature Analysis Testing 207
Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions 207
Characterization of the Over-Erase Algorithm in FN/FN embedded NOR Flash arrays 207
Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization 206
Impact of Pulsed Operation on Performance and Reliability of Flash Memories 205
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays 201
Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage 199
Impact of the NAND Flash Power Supply on Solid State Drives Reliability and Performance 199
Bit error rate analysis in Charge Trapping memories for SSD applications 197
SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives 197
Power-supply impact on the reliability of mid-1X TLC NAND flash memories 197
Resistive RAM technology for SSDs 197
Automated Test Equipment for research on Non volatile memories 196
Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays 196
Erratic bits in Flash memories under Fowler-Nordheim programming 195
Reliability and performance characterization of a mems-based non-volatile switch 194
Analysis of Erratic Bits in FLASH Memories 193
A Novel Critical Path Heuristic for Fast Fault Grading 193
Hot Electrons in MOS Transistors: Lateral Distribution of the Trapped Oxide Charge 192
Characterization of a MEMS-based embedded non volatile memory array for extreme environments 189
Characterization of flash structures erased with ultra-short pulses 188
Dynamics of Fast-Erasing Bits in Flash Memories 188
Electron trapping/detrapping within thin SiO2 films in the high field tunneling regime 187
Simulations of RRAM-based SSDs 187
Design trade-offs for NAND flash-based SSDs 187
SSDExplorer: A virtual platform for SSD simulations 187
Quantum Effects in Accumulation Layers of Si-SiO2 Interfaces in the WKB Effective Mass Approximation 186
Correlation between IDDQ Testing Quality and Sensor Accuracy 186
Erratic Bits Classification for Efficient Repair Strategies in Automotive Embedded Flash Memories 185
Limits of sensing and storage electronic components for high-reliable and safety-critical automotive applications 185
Advanced spice-like modeling of E2PROM cells 184
Correlated Fluctuations and Noise Spectra of Tunneling and Substrate Currents Before Breakdown in Thin-Oxide MOS Devices 184
Affidabilità di sistemi wireless 183
Modeling the Endurance Reliability of Intra-disk RAID Solutions for mid-1X TLC NAND Flash Solid State Drives 183
Threshold voltage spread in Flash memories under a constant DQ erasing scheme 182
Analysis of Erratic Bits in Flash Memories 181
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices 180
Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays 179
Memory driven design methodologies for optimal SSD performance 179
Reliability of erasing operation in NOR-Flash memories 178
Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off 178
Compact Modeling of Negative Vₜ Shift Disturb in NAND Flash Memories 178
Drain-accelerated degradation of tunnel oxides in Flash memories 178
A scalable bidimensional randomization scheme for tlc 3d nand flash memories 178
Totale 23.921
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Categoria #
all - tutte 164.784
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 13.276
Totale 178.060
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/20221.716 0 0 0 44 169 126 126 107 116 166 199 663
2022/20231.755 207 17 82 183 230 289 174 167 213 10 139 44
2023/2024721 105 108 21 28 50 38 27 51 17 24 10 242
2024/20254.159 92 181 356 55 451 503 181 316 487 574 653 310
2025/202611.225 924 546 989 1.471 1.773 692 1.315 566 1.106 1.273 368 202
2026/20272.264 311 619 1.064 270 0 0 0 0 0 0 0 0
Totale 38.213