CHIMENTON, Andrea
 Distribuzione geografica
Continente #
NA - Nord America 3.630
EU - Europa 646
AS - Asia 588
AF - Africa 1
Continente sconosciuto - Info sul continente non disponibili 1
Totale 4.866
Nazione #
US - Stati Uniti d'America 3.613
CN - Cina 363
UA - Ucraina 231
SG - Singapore 110
TR - Turchia 108
DE - Germania 102
GB - Regno Unito 99
IT - Italia 87
FI - Finlandia 59
SE - Svezia 34
CA - Canada 17
BE - Belgio 10
FR - Francia 8
RU - Federazione Russa 6
NL - Olanda 5
KR - Corea 4
ES - Italia 2
CZ - Repubblica Ceca 1
EU - Europa 1
HR - Croazia 1
HU - Ungheria 1
JP - Giappone 1
LK - Sri Lanka 1
MA - Marocco 1
TW - Taiwan 1
Totale 4.866
Città #
Fairfield 573
Woodbridge 492
Houston 311
Jacksonville 248
Seattle 216
Ashburn 211
Santa Clara 208
Ann Arbor 201
Cambridge 195
Wilmington 192
Chandler 146
Nanjing 82
Singapore 82
Izmir 77
Beijing 63
Princeton 50
San Diego 48
Addison 47
Boardman 45
Ferrara 31
Milan 31
Nanchang 29
Shenyang 27
Shanghai 23
Los Angeles 21
Jiaxing 18
Ottawa 17
Changsha 13
Auburn Hills 12
Helsinki 11
Brussels 10
Tianjin 10
Hebei 9
Settimo Milanese 9
London 8
Mountain View 8
Ningbo 8
Xian 8
Dearborn 7
Redwood City 7
San Mateo 7
Falls Church 6
Verona 6
Indiana 5
Kunming 5
Norwalk 5
Guangzhou 4
Jinan 4
Zhengzhou 4
Amsterdam 3
Changchun 3
Orange 3
Philadelphia 3
Bologna 2
Chicago 2
Clifton 2
Hangzhou 2
New York 2
Taizhou 2
Venice 2
Acton 1
Budapest 1
Chiswick 1
Dambulla 1
Des Moines 1
Detroit 1
Dresden 1
Falkenstein 1
Izhevsk 1
Kilburn 1
Lanzhou 1
Madrid 1
Qingdao 1
Redmond 1
Rome 1
Saint Petersburg 1
San Jose 1
Santa Cruz de Tenerife 1
Simi Valley 1
Solingen 1
Southwark 1
Taipei 1
Tappahannock 1
Tokyo 1
Wandsworth 1
Washington 1
Yellow Springs 1
Zagreb 1
Zlatoust 1
Totale 3.905
Nome #
Statistical Methodologies for Integrated Circuits Design 129
Impact of Pulsed Operation on Performance and Reliability of Flash Memories 128
Overerase Phenomena: An Insight into Flash memory Reliability 128
Constant charge erasing scheme for Flash Memories 128
Erratic bits in flash memories under Fowler-Nordheim programming 124
Threshold voltage spread in Flash memories under a constant DQ erasing scheme 122
Empirical investigation of SET Seasoning Effects in Phase Change Memory arrays 120
A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique 119
Reliability and performance characterization of a mems-based non-volatile switch 116
Dielectric reliability for future logic and Non-Volatile Memory applications: a statistical simulation analysis approach 116
Monte-Carlo Simulations of Flash Memory Array Retention 115
Reliability of erasing operation in NOR-Flash memories 114
Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays 113
Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays 112
Non Volatile Memory Partitioning Scheme for Technology-based Performance-Reliability Trade-off 111
A Statistical Model of Erratic Behaviors in Flash Memory Arrays 111
Improving performance and reliability of NOR-Flash arrays by using pulsed operation 109
Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays 107
A New Methodology for Two Level Random-Telegraph-Noise Identification and Statistical Analysis 107
Dynamics of Fast-Erasing Bits in Flash Memories 106
Electrical Characterization and Modeling of Phase Change Memory arrays 106
Erratic bits in Flash memories under Fowler-Nordheim programming 105
A New Analytical Model of the Erasing Operation in Phase Change Memories 105
A new automated methodology for Random Telegraph Signal identification and characterization: a case study on Phase Change Memory arrays 105
Impact of Tunnel Oxide Thickness on Erratic Erase in Flash Memories 105
Statistical Modeling of Secondary Path during Erase Operation in Phase Change Memories 104
Analysis and Optimization of Erasing Waveform in Phase Change Memory Arrays 104
Fast Identification of Critical Electrical Disturbs in Nonvolatile Memories 103
Impact of High Tunneling Electric Fields on Erasing Instabilities in NOR-Flash Memories 102
Modeling of SET Seasoning Effects in Phase Change Memory Arrays 102
Threshold voltage spread in Flash memories under a constant DQ erasing scheme 101
Flash Memory Reliability: an improvement against Erratic Erase phenomena using the Constant Charge Erasing Scheme 100
Analysis of Erratic Bits in Flash Memories 100
Evidence of erratic behaviors in p-channel floating gate memories and cell architectural solution 98
Reliability of Floating Gate Memories 97
Analysis of Erratic Bits in FLASH Memories 92
Flash Memory Reliability: an Improvement Against Erratic Erase Phenomena Using the Constant Charge Erasing Scheme 92
Ultra-short pulses improving performance and reliability in flash memories 90
Drain-accelerated degradation of tunnel oxides in Flash memories 89
Reliability of Flash Memory Erasing Operation under High Tunneling Electric Fields 86
Reliability in Wireless Systems 85
Experimental characterization of SET Seasoning on Phase Change Memory arrays 82
Erratic Erase in Flash Memories (part I): Basic Experimental and Statistical Characterization 79
Erratic Erase in Flash Memories (Part II): Dependence on Operating Conditions 74
Affidabilità di sistemi wireless 71
Reliability of NAND Flash Memories 65
Generation rate of Erratic bits in Flash Memories 62
Pulsed Tunnel Operating Non Volatile Flash Memories with SILC Reduction 42
Anomalous charge loss from Floating-Gate Memory Cells due to heavy ions irradiation 14
Totale 4.895
Categoria #
all - tutte 21.669
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 1.365
Totale 23.034


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020654 0 0 0 0 0 124 121 129 99 96 57 28
2020/2021621 65 73 13 77 22 74 31 78 17 82 61 28
2021/2022571 13 81 66 11 13 23 33 27 15 36 72 181
2022/2023423 51 2 13 47 62 78 27 36 63 2 29 13
2023/2024185 36 23 6 9 6 5 6 20 7 13 0 54
2024/2025395 29 53 76 4 108 125 0 0 0 0 0 0
Totale 4.895