GROSSI, Alessandro
GROSSI, Alessandro
Dipartimento di Ingegneria
An automated test equipment for characterization of emerging MRAM and RRAM arrays
2018 Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Pellati, Paolo; Ramponi, Michele; Wenger, Christian; Alvarez-Herault, Jeremy; Mackay, Ken
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance
2017 Perez, E; Bondesan, L.; Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Wenger, C. h.
Automated characterization of TAS-MRAM test arrays
2015 Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Pellati, Paolo; Ramponi, Michele; Alvarez Herault, Jeremy; Mackay, Ken
Bit error rate analysis in Charge Trapping memories for SSD applications
file con accesso da definire2014 Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays
2018 Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Nowak, Etienne; Molas, Gabriel; Nodin, Jean Francois; Perniola, Luca
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2
2017 Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Crespo Yepes, Alberto; Martin Martinez, Javier; Rodríguez, Rosana; Nafria, Monserrat; Perez, Eduardo; Wenger, Christian
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays
2016 Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Miranda, Enrique; Stikanov, Valeriy; Walczyk, Christian; Wenger, Christian
Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions
file con accesso da definire2014 Zambelli, Cristian; Grossi, Alessandro; Olivo, Piero; D., Walczyk; J., Dabrowski; B., Tillack; T., Schroeder; R., Kraemer; V., Stikanov; C., Walczyk
Emerging non volatile memories reliability
2017 Grossi, Alessandro
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM
2018 Grossi, Alessandro; Vianello, Elisa; Zambelli, Cristian; Royer, Pablo; Noel, Jean-Philippe; Giraud, Bastien; Perniola, Luca; Olivo, Piero; Nowak, Etienne
Fundamental variability limits of filament-based RRAM
file con accesso da definire2016 Grossi, Alessandro; Nowak, E.; Zambelli, Cristian; Pellissier, C.; Bernasconi, S.; Cibrario, G.; Hajjam, K. El; Crochemore, R.; Nodin, J. F.; Olivo, Piero; Perniola, L.
Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays
2015 Grossi, Alessandro; Walczyk, Damian; Zambelli, Cristian; Miranda, Enrique; Olivo, Piero; Stikanov, Valeriy; Feriani, Alessandro; Sune, Jordi; Schoof, Gunter; Kraemer, Rolf; Tillack, Bernd; Fox, Alexander; Schroeder, Thomas; Wenger, Christian; Walczyk, Christian
Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices
2017 Pérez, Eduardo; Wenger, Christian; Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Roelofs, Robin
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays
2017 Perez, Eduardo; Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Wenger, Christian
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices
2018 Grossi, Alessandro; Perez, Eduardo; Zambelli, Cristian; Olivo, Piero; Miranda, Enrique; Roelofs, Robin; Woodruff, Jacob; Raisanen, Petri; Li, Wei; Givens, Michael; Costina, Ioan; Schubert, Markus Andreas; Wenger, Christian
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays
2016 Crupi, Felice; Filice, Francesco; Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Perez, Eduardo; Wenger, Christian
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays
2017 Niu, Gang; Cartoixà, Xavier; Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Perez, Eduardo; Schubert, Markus Andreas; Zaumseil, Peter; Costina, Ioan; Schroeder, Thomas; Wenger, Christian
Memory System Architecture Optimization for Enterprise All-RRAM Solid State Drives
file con accesso da definire2016 Zuolo, Lorenzo; Zambelli, Cristian; Grossi, Alessandro; Micheloni, Rino; Bates, Stephen; Olivo, Piero
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2
2016 Grossi, Alessandro; Perez, Eduardo; Zambelli, Cristian; Olivo, Piero; Wenger, Christian
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives
2015 Grossi, Alessandro; Zuolo, Lorenzo; Restuccia, Francesco; Zambelli, Cristian; Olivo, Piero
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
An automated test equipment for characterization of emerging MRAM and RRAM arrays | 2018 | Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Pellati, Paolo; Ramponi, Michele; Wenger, C...hristian; Alvarez-Herault, Jeremy; Mackay, Ken | |
Assessing the forming temperature role on amorphous and polycrystalline HfO2-based 4 kbit RRAM arrays performance | 2017 | Perez, E; Bondesan, L.; Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Wenger, C. h. | |
Automated characterization of TAS-MRAM test arrays | 2015 | Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Pellati, Paolo; Ramponi, Michele; Alvarez H...erault, Jeremy; Mackay, Ken | |
Bit error rate analysis in Charge Trapping memories for SSD applications | 2014 | Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero | file con accesso da definire |
Cell-to-cell Fundamental Variability Limits Investigation in OxRRAM arrays | 2018 | Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Nowak, Etienne; Molas, Gabriel; Nodin, Jean... Francois; Perniola, Luca | |
Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2 | 2017 | Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Crespo Yepes, Alberto; Martin Martinez, Jav...ier; Rodríguez, Rosana; Nafria, Monserrat; Perez, Eduardo; Wenger, Christian | |
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays | 2016 | Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Miranda, Enrique; Stikanov, Valeriy; Walczy...k, Christian; Wenger, Christian | |
Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions | 2014 | Zambelli, Cristian; Grossi, Alessandro; Olivo, Piero; D., Walczyk; J., Dabrowski; B., Tillack; T...., Schroeder; R., Kraemer; V., Stikanov; C., Walczyk | file con accesso da definire |
Emerging non volatile memories reliability | 2017 | Grossi, Alessandro | |
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM | 2018 | Grossi, Alessandro; Vianello, Elisa; Zambelli, Cristian; Royer, Pablo; Noel, Jean-Philippe; Girau...d, Bastien; Perniola, Luca; Olivo, Piero; Nowak, Etienne | |
Fundamental variability limits of filament-based RRAM | 2016 | Grossi, Alessandro; Nowak, E.; Zambelli, Cristian; Pellissier, C.; Bernasconi, S.; Cibrario, G.; ...Hajjam, K. El; Crochemore, R.; Nodin, J. F.; Olivo, Piero; Perniola, L. | file con accesso da definire |
Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays | 2015 | Grossi, Alessandro; Walczyk, Damian; Zambelli, Cristian; Miranda, Enrique; Olivo, Piero; Stikanov..., Valeriy; Feriani, Alessandro; Sune, Jordi; Schoof, Gunter; Kraemer, Rolf; Tillack, Bernd; Fox, Alexander; Schroeder, Thomas; Wenger, Christian; Walczyk, Christian | |
Impact of temperature on conduction mechanisms and switching parameters in HfO2-based 1T-1R resistive random access memories devices | 2017 | Pérez, Eduardo; Wenger, Christian; Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Roelofs,... Robin | |
Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO2-Based RRAM Arrays | 2017 | Perez, Eduardo; Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Wenger, Christian | |
Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices | 2018 | Grossi, Alessandro; Perez, Eduardo; Zambelli, Cristian; Olivo, Piero; Miranda, Enrique; Roelofs, ...Robin; Woodruff, Jacob; Raisanen, Petri; Li, Wei; Givens, Michael; Costina, Ioan; Schubert, Markus Andreas; Wenger, Christian | |
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays | 2016 | Crupi, Felice; Filice, Francesco; Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Perez, Ed...uardo; Wenger, Christian | |
Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays | 2017 | Niu, Gang; Cartoixà, Xavier; Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Perez, Eduardo...; Schubert, Markus Andreas; Zaumseil, Peter; Costina, Ioan; Schroeder, Thomas; Wenger, Christian | |
Memory System Architecture Optimization for Enterprise All-RRAM Solid State Drives | 2016 | Zuolo, Lorenzo; Zambelli, Cristian; Grossi, Alessandro; Micheloni, Rino; Bates, Stephen; Olivo, P...iero | file con accesso da definire |
Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2 | 2016 | Grossi, Alessandro; Perez, Eduardo; Zambelli, Cristian; Olivo, Piero; Wenger, Christian | |
Quality of Service implications of Enhanced Program Algorithms for Charge Trapping NAND in future Solid State Drives | 2015 | Grossi, Alessandro; Zuolo, Lorenzo; Restuccia, Francesco; Zambelli, Cristian; Olivo, Piero |