The cold crystallization process in poly(ethylene terephthalate) (PET) spin-coated ultrathin films was studied by infrared spectroscopy. The conformational change associated to the formation of crystal phase during annealing at 107 degrees C was measured in real time, by monitoring both intensity and frequency shift of trans and gauche conformer bands of the PET glycol segment. Enhancement of crystallization kinetics was observed in thin films deposited on amorphous silicon, with respect to a 20 mu m thick free standing film used as reference, where the fastest kinetics was observed for the thinnest (35 nm) film. Experimental findings were interpreted in terms of scarce interaction between PET films and silicon substrate, which does not provide slowing down of crystallization kinetics as observed on different substrates. This results in a dominant effect of the polymer/air interface, where faster kinetics is observed, as also confirmed by atomic force microscopy imaging, particularly on the thinnest film. Additionally, Avrami and Avramov analyses evidence a decrease of both the Avrami exponent, related to growth dimensionality, and induction time, related to delay of nucleation start, when decreasing film thickness. Therefore, the reported results enrich the description of confinement and substrate interaction effects on the cold crystallization process taking place in PET ultrathin films.
Enhanced crystallization kinetics in poly(ethylene terephthalate) thin films evidenced by infrared spectroscopy RID E-9799-2011 RID A-8503-2012
Bertoldo M
Writing – Original Draft Preparation
;
2010
Abstract
The cold crystallization process in poly(ethylene terephthalate) (PET) spin-coated ultrathin films was studied by infrared spectroscopy. The conformational change associated to the formation of crystal phase during annealing at 107 degrees C was measured in real time, by monitoring both intensity and frequency shift of trans and gauche conformer bands of the PET glycol segment. Enhancement of crystallization kinetics was observed in thin films deposited on amorphous silicon, with respect to a 20 mu m thick free standing film used as reference, where the fastest kinetics was observed for the thinnest (35 nm) film. Experimental findings were interpreted in terms of scarce interaction between PET films and silicon substrate, which does not provide slowing down of crystallization kinetics as observed on different substrates. This results in a dominant effect of the polymer/air interface, where faster kinetics is observed, as also confirmed by atomic force microscopy imaging, particularly on the thinnest film. Additionally, Avrami and Avramov analyses evidence a decrease of both the Avrami exponent, related to growth dimensionality, and induction time, related to delay of nucleation start, when decreasing film thickness. Therefore, the reported results enrich the description of confinement and substrate interaction effects on the cold crystallization process taking place in PET ultrathin films.I documenti in SFERA sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
