Energy-dispersive X-ray diffraction is applied to investigate double-layer PBCO/YBCO thin ®lms deposited by laser ablation. The merits of this technique for the structural study of ®lms are discussed. It is shown that the rocking curves of the Bragg re¯ections of a ®lm along the c direction can be simultaneously collected, allowing the accurate evaluation of its angular spread. A systematic displacement of the rocking curves of the ®lm with respect to those of the substrate was found, revealing a slight divergence of the growth direction from the normal to the substrate surface.
Energy-dispersive X-ray diffraction on thin films and its application to superconducting samples
Meloni, S.;Caminiti, R.;
2003
Abstract
Energy-dispersive X-ray diffraction is applied to investigate double-layer PBCO/YBCO thin ®lms deposited by laser ablation. The merits of this technique for the structural study of ®lms are discussed. It is shown that the rocking curves of the Bragg re¯ections of a ®lm along the c direction can be simultaneously collected, allowing the accurate evaluation of its angular spread. A systematic displacement of the rocking curves of the ®lm with respect to those of the substrate was found, revealing a slight divergence of the growth direction from the normal to the substrate surface.File in questo prodotto:
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