In existing approaches to IDDQ fault simulation, the lack of estimate of the faulty current values in comparison with the instrumentation sensitivity prevents from realistic assessments of testing quality. This paper fills the gap, presenting a method to estimate the faulty current considering the device conductances as well as the bridging resistance, and computing the fault coverage as a function of the sensor accuracy. Such information helps in the design of current monitoring equipments.
Correlation between IDDQ Testing Quality and Sensor Accuracy
FAVALLI, Michele;OLIVO, Piero
1995
Abstract
In existing approaches to IDDQ fault simulation, the lack of estimate of the faulty current values in comparison with the instrumentation sensitivity prevents from realistic assessments of testing quality. This paper fills the gap, presenting a method to estimate the faulty current considering the device conductances as well as the bridging resistance, and computing the fault coverage as a function of the sensor accuracy. Such information helps in the design of current monitoring equipments.File in questo prodotto:
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