NALLI, ANDREA
 Distribuzione geografica
Continente #
NA - Nord America 865
EU - Europa 374
AS - Asia 158
AF - Africa 2
OC - Oceania 1
SA - Sud America 1
Totale 1.401
Nazione #
US - Stati Uniti d'America 863
PL - Polonia 150
CN - Cina 84
IT - Italia 77
UA - Ucraina 45
TR - Turchia 41
SE - Svezia 29
DE - Germania 28
SG - Singapore 26
GB - Regno Unito 25
FI - Finlandia 11
FR - Francia 4
ID - Indonesia 4
CA - Canada 2
LT - Lituania 2
MA - Marocco 2
VN - Vietnam 2
AU - Australia 1
BE - Belgio 1
BG - Bulgaria 1
BR - Brasile 1
ES - Italia 1
KR - Corea 1
Totale 1.401
Città #
Warsaw 150
Fairfield 126
Houston 100
Woodbridge 96
Ashburn 83
Ann Arbor 58
Jacksonville 58
Seattle 56
Wilmington 47
Chandler 44
Ferrara 44
Cambridge 43
Beijing 36
Nanjing 22
Singapore 20
Izmir 14
Milan 13
Princeton 13
San Diego 11
Boardman 9
Addison 5
Los Angeles 5
Washington 5
Cagliari 4
Jakarta 4
Kunming 4
Nanchang 4
Shanghai 4
Hebei 3
London 3
Santa Clara 3
Shenyang 3
Tianjin 3
Changsha 2
Dearborn 2
Dong Ket 2
Indiana 2
Mountain View 2
Munich 2
Norwalk 2
Paris 2
Parma 2
Settimo Milanese 2
Toronto 2
Vancouver 2
Brussels 1
Chicago 1
Council Bluffs 1
Daejeon 1
Des Moines 1
Frankfurt am Main 1
Freiburg 1
Haikou 1
Jiaxing 1
Leipzig 1
Mataró 1
Melbourne 1
Newcastle upon Tyne 1
Orange 1
Pisa 1
Redmond 1
Redwood City 1
Sao Jose do Mantimento 1
Trieste 1
Walnut 1
Yellow Springs 1
Zhengzhou 1
Totale 1.139
Nome #
CHARACTERIZATION AND MODELING OF III-V TRANSISTORS FOR MICROWAVE CIRCUIT DESIGN 190
GaN HEMT Noise Model Based on Electromagnetic Simulations 174
Extremely Low-Frequency Measurements Using an Active Bias Tee 130
GaN HEMT noise modeling based on 50-Ω noise factor 127
Linear versus nonlinear de-embedding: Experimental investigation 113
Identification of the optimum operation for GaN HEMTs in high-power amplifiers 108
GaN Ku-band low-noise amplifier design including RF life test 106
Evaluation of FET performance and restrictions by low-frequency measurements 105
Characterization of charge-trapping effects in GaN FETs through low-frequency measurements 101
null 92
null 63
null 55
A Load–Pull Characterization Technique Accounting for Harmonic Tuning 24
GaN HEMT Modelling Through 50-Ω NF Measurements 18
A scalable HEMT noise model based on FW-EM analyses 17
Totale 1.423
Categoria #
all - tutte 5.604
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 5.604


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020232 0 0 0 0 25 36 30 30 30 31 40 10
2020/2021236 21 15 12 21 12 22 19 25 9 50 18 12
2021/2022144 10 8 12 4 17 7 5 7 5 7 20 42
2022/2023116 12 1 3 9 18 23 15 9 17 0 6 3
2023/202476 8 6 6 4 17 8 3 5 3 0 3 13
2024/202547 5 3 26 6 7 0 0 0 0 0 0 0
Totale 1.423