In the context of the LAUE project devoted to build a long focal-length focusing optics for soft -ray astronomy (80-600 keV), we present the results of reflectivity measurements of bent crystals in different configurations, obtained by bending perfect or mosaic flat crystals. We also compare these results with those obtained using flat crystals. The measurements were performed using the Kα line of the Tungsten anode of the γ-ray tube in the LARIX facility at the University of Ferrara. These results are finalized to select the best materials and to optimize the thickness of the crystal tiles that will be used for building a Laue lens petal which is a part of an entire Laue lens, with 20 m focal length and 100-300 keV passband. The final goal of the LAUE project is to overcome, by at least 2 orders of magnitude, the sensitivity limits of the current generation of γ-ray telescopes, and to improve the current γ-ray imaging capability. © 2012 SPIE.
Characterization of bent crystals for Laue lenses
LICCARDO, Vincenzo;VIRGILLI, Enrico;FRONTERA, Filippo;VALSAN, Vineeth
2012
Abstract
In the context of the LAUE project devoted to build a long focal-length focusing optics for soft -ray astronomy (80-600 keV), we present the results of reflectivity measurements of bent crystals in different configurations, obtained by bending perfect or mosaic flat crystals. We also compare these results with those obtained using flat crystals. The measurements were performed using the Kα line of the Tungsten anode of the γ-ray tube in the LARIX facility at the University of Ferrara. These results are finalized to select the best materials and to optimize the thickness of the crystal tiles that will be used for building a Laue lens petal which is a part of an entire Laue lens, with 20 m focal length and 100-300 keV passband. The final goal of the LAUE project is to overcome, by at least 2 orders of magnitude, the sensitivity limits of the current generation of γ-ray telescopes, and to improve the current γ-ray imaging capability. © 2012 SPIE.I documenti in SFERA sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
