In this work we will study the effects of electromagnetic interferences conveyed to the supply rails of integrated bipolar operational amplifiers. In particular, with reference to the well known μA741 topology, we will show that amplifiers undergo very strong failures when subjected to EMI conveyed to the negative supply, while they are only moderately sensible to interferences conveyed to the positive supply. Finally, on the basis of detailed circuit analyses and simulations, we will report the physical origin of such failures.

Failures induced on bipolar operational amplifiers from electromagnetic interferences conducted on the power supply rails

SETTI, Gianluca
1999

Abstract

In this work we will study the effects of electromagnetic interferences conveyed to the supply rails of integrated bipolar operational amplifiers. In particular, with reference to the well known μA741 topology, we will show that amplifiers undergo very strong failures when subjected to EMI conveyed to the negative supply, while they are only moderately sensible to interferences conveyed to the positive supply. Finally, on the basis of detailed circuit analyses and simulations, we will report the physical origin of such failures.
1999
0780352203
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11392/1195872
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